Elena I. Vatajelu

24 papers A 3B 4C 2Journal 4Unranked 11
YearRankTypeTitle / Venue / Authors
2024 — conf
Resiliency Approaches in Convolutional, Photonic, and Spiking Neural Networks.
LATS
Alberto Bosio, M. Gomes, Fabio Pavanello, A. Porsia, Annachiara Ruospo, Ernesto Sánchez, Elena I. Vatajelu
2022 J jnl
Guest Editorial: Computation-In-Memory (CIM): from Device to Applications.
ACM J. Emerg. Technol. Comput. Syst.
Said Hamdioui, Elena I. Vatajelu, Alberto Bosio
2020 J jnl
Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices.
J. Electron. Test.
Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Gabriella Trucco, Elena I. Vatajelu
2019 — conf
Fault Mitigation of Switching Lattices under the Stuck-At-Fault Model.
LATS
Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Gabriella Trucco, Elena I. Vatajelu
2019 — conf
Rebooting Computing: The Challenges for Test and Reliability.
DFT
Alberto Bosio, Ian O'Connor, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Elena I. Vatajelu, Giorgio Di Natale, Lorena Anghel, Surya Nagarajan, Moritz Fieback, Said Hamdioui
2015 B conf
Power-aware voltage tuning for STT-MRAM reliability.
ETS
Elena I. Vatajelu, Rosa Rodríguez-Montañés, Stefano Di Carlo, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras
2015 A conf
Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell.
DATE
Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras
2015 — conf
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations.
DTIS
Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Paolo Prinetto, Joan Figueras
2014 — conf
Integration of STT-MRAM model into CACTI simulator.
IDT
S. Arcaro, Stefano Di Carlo, Marco Indaco, D. Pala, Paolo Prinetto, Elena I. Vatajelu
2014 — conf
Nonvolatile memories: Present and future challenges.
IDT
Elena I. Vatajelu, Hassen Aziza, Cristian Zambelli
2014 B conf
On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial).
ETS
Marco Indaco, Paolo Prinetto, Elena I. Vatajelu
2014 — conf
Reliability estimation at block-level granularity of spin-transfer-torque MRAMs.
DFT
Stefano Di Carlo, Marco Indaco, Paolo Prinetto, Elena I. Vatajelu, Rosa Rodríguez-Montañés, Joan Figueras
2014 J jnl
Sram cell stability metric under transient voltage noise.
Microelectron. J.
Elena I. Vatajelu, Álvaro Gómez-Pau, Michel Renovell, Joan Figueras
2013 — conf
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing.
Asian Test Symposium
Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 B conf
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability.
ETS
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 — conf
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures.
DTIS
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 J jnl
Domino logic designs for high-performance and leakage-tolerant applications.
Integr.
Farshad Moradi, Tuan Vu Cao, Elena I. Vatajelu, Ali Peiravi, Hamid Mahmoodi, Dag T. Wisland
2013 — conf
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.
DFTS
Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
2013 C conf
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.
IOLTS
Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
2012 A conf
Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation.
DATE
Elena I. Vatajelu, Joan Figueras
2011 C conf
New reliability mechanisms in memory design for sub-22nm technologies.
IOLTS
Nivard Aymerich, A. Asenov, Andrew R. Brown, Ramon Canal, Binjie Cheng, Joan Figueras, Antonio González, Enric Herrero, S. Markov, Miguel Miranda, Peyman Pouyan, Tanausú Ramírez, Antonio Rubio, Elena I. Vatajelu, Xavier Vera, Xingsheng Wang, Paul Zuber
2011 A conf
Robustness analysis of 6T SRAMs in memory retention mode under PVT variations.
DATE
Elena I. Vatajelu, Joan Figueras
2011 — conf
Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric.
Asian Test Symposium
Elena I. Vatajelu, Álvaro Gómez-Pau, Michel Renovell, Joan Figueras
2010 B conf
Parametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis.
ETS
Elena I. Vatajelu, Georgios Panagopoulos, Kaushik Roy, Joan Figueras