Elaine Crespo Marques

12 papers C 1Journal 6Unranked 5
YearRankTypeTitle / Venue / Authors
2020 J jnl
Magnetic Tunnel Junction Applications.
Sensors
Nilson Maciel, Elaine Crespo Marques, Lirida A. B. Naviner, Yongliang Zhou, Hao Cai
2020 — conf
Magnetic Tunnel Junction-based Analog-to-Digital Converter using Spin Orbit Torque Mechanism.
ICECS
Nilson Maciel, Elaine Crespo Marques, Lírida A. B. Naviner, Hao Cai
2019 J jnl
A Review of Sparse Recovery Algorithms.
IEEE Access
Elaine Crespo Marques, Nilson Maciel, Lirida A. B. Naviner, Hao Cai, Jun Yang
2019 C conf
Deep Learning Approaches for Sparse Recovery in Compressive Sensing.
ISPA
Elaine Crespo Marques, Nilson Maciel, Lirida A. B. Naviner, Hao Cai, Jun Yang
2019 — conf
Nonlinear Functions in Learned Iterative Shrinkage-Thresholding Algorithm for Sparse Signal Recovery.
SiPS
Elaine Crespo Marques, Nilson Maciel, Lirida A. B. Naviner, Hao Cai, Jun Yang
2018 — conf
Compressed Sensing for Wideband HF Channel Estimation.
ICFSP
Elaine Crespo Marques, Nilson Maciel, Lirida A. B. Naviner, Hao Cai, Jun Yang
2018 J jnl
Single-event transient effects on dynamic comparator in 28 nm FDSOI CMOS technology.
Microelectron. Reliab.
Nilson Maciel, Elaine Crespo Marques, Lirida A. B. Naviner, Hao Cai
2017 — conf
Sparsity analysis using a mixed approach with greedy and LS algorithms on channel estimation.
ICFSP
Nilson Maciel de Paiva, Elaine Crespo Marques, Lirida Alves de Barros Naviner
2015 — conf
Sparsity-aware direct decision-feedback equalization of ionospheric HF channels.
MILCOM
Francisco C. Ribeiro, Elaine Crespo Marques, Nilson M. Paiva Jr., Juraci F. Galdino
2011 J jnl
FIFA: A fault-injection-fault-analysis-based tool for reliability assessment at RTL level.
Microelectron. Reliab.
Lirida A. B. Naviner, Jean-François Naviner, G. G. dos Santos Jr., Elaine Crespo Marques, Nilson M. Paiva Jr.
2010 J jnl
An efficient tool for reliability improvement based on TMR.
Microelectron. Reliab.
Elaine Crespo Marques, Lirida A. B. Naviner, Jean-François Naviner
2010 J jnl
Using error tolerance of target application for efficient reliability improvement of digital circuits.
Microelectron. Reliab.
G. G. dos Santos, Elaine Crespo Marques, Lirida A. B. Naviner, Jean-François Naviner