Egor S. Sogomonyan

37 papers A 2B 1C 7Misc 9Journal 9Unranked 9

Year	Rank	Type	Title / Venue / Authors
2020	J	`jnl`	Full Error Detection and Correction Method Applied on Pipelined Structure Using Two Approaches. J. Circuits Syst. Comput. Mehmed Dug, Stefan Weidling, Egor S. Sogomonyan, Dejan Jokic, Milos Krstic
2016	J	`jnl`	Enhanced architectures for soft error detection and correction in combinational and sequential circuits. Microelectron. Reliab. Milos Krstic, Stefan Weidling, Vladimir Petrovic, Egor S. Sogomonyan
2013	C	`conf`	A new method for correcting time and soft errors in combinational circuits. DDECS Egor S. Sogomonyan, Stefan Weidling, Michael Gössel
2013	C	`conf`	Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. DSD Stefan Weidling, Egor S. Sogomonyan, Michael Gössel
2008	J	`jnl`	A Non-linear Split Error Detection Code. Fundam. Informaticae Michael Gössel, Egor S. Sogomonyan
2006	C	`conf`	A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
2006	J	`jnl`	Modulo J. Electron. Test. Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
2006	C	`conf`	On-line Fault Detection and Location for NoC Interconnects. IOLTS Cristian Grecu, André Ivanov, Res Saleh, Egor S. Sogomonyan, Partha Pratim Pande
2005	—	`conf`	New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
2004	A	`conf`	A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel
2004	B	`conf`	A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. ETS Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
2004	C	`conf`	Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel
2004	—	`conf`	Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel
2003	C	`conf`	A Modulo p Checked Self-Checking Carry Select Adder. IOLTS Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
2003	J	`jnl`	Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan
2003	C	`conf`	Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba
2002	—	`conf`	A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
2002	—	`conf`	Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan
2002	Misc	`conf`	Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS Michael Gössel, Egor S. Sogomonyan, Adit D. Singh
2001	—	`conf`	A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel
2001	—	`conf`	Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan
2001	Misc	`conf`	Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS Egor S. Sogomonyan, Andrej A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh
1999	J	`jnl`	A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electron. Test. Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
1999	Misc	`conf`	A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS Michael Gössel, Andrej A. Morosov, Egor S. Sogomonyan
1999	A	`conf`	Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring
1998	Misc	`conf`	A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
1998	Misc	`conf`	A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS Markus Seuring, Michael Gössel, Egor S. Sogomonyan
1997	Misc	`conf`	A linear code-preserving signature analyzer COPMISR. VTS Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan
1997	—	`conf`	Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan
1996	J	`jnl`	A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electron. Test. Michael Gössel, Egor S. Sogomonyan
1996	Misc	`conf`	Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS Egor S. Sogomonyan, Michael Gössel
1996	J	`jnl`	Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick
1994	Misc	`conf`	Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS Michael Gössel, Egor S. Sogomonyan
1993	—	`conf`	Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT Egor S. Sogomonyan, Michael Gössel
1993	J	`jnl`	Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electron. Test. Egor S. Sogomonyan, Michael Gössel
1993	—	`conf`	Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI Michael Gössel, Egor S. Sogomonyan
1992	Misc	`conf`	Self-testing and self-checking combinational circuits with weakly independent outputs. VTS Egor S. Sogomonyan, Michael Gössel