| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
PRIME
|
| 2025 | — | conf |
NewCAS
|
| 2025 | C | conf |
IOLTS
|
| 2023 | B | conf |
ETS
|
| 2023 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2020 | C | conf |
ISCAS
|
| 2020 | — | conf |
NEWCAS
|
| 2020 | C | conf |
ISCAS
|
| 2020 | — | conf |
NEWCAS
|
| 2020 | J | jnl |
Circuits Syst. Signal Process.
|
| 2019 | — | conf |
DCIS
|
| 2018 | C | conf |
ISCAS
|
| 2018 | — | conf |
ICECS
|
| 2017 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | A | conf |
DATE
|
| 2016 | B | conf |
ETS
|
| 2016 | J | jnl |
Integr.
|
| 2015 | — | conf |
LASCAS
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | — | conf |
ICECS
|
| 2014 | B | conf |
ETS
|
| 2012 | C | conf |
ISCAS
|
| 2012 | — | conf |
ICECS
|
| 2011 | — | conf |
ECCTD
|
| 2011 | — | conf |
ESSCIRC
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | — | conf |
ICECS
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2010 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2010 | C | conf |
ISCAS
|
| 2010 | — | conf |
ICECS
|
| 2009 | — | conf |
ECCTD
|
| 2009 | — | conf |
ECCTD
|
| 2009 | — | conf |
SBCCI
|
| 2008 | — | conf |
APCCAS
|
| 2008 | — | conf |
SBCCI
|
| 2008 | — | conf |
APCCAS
|
| 2008 | J | jnl |
VLSI Design
|
| 2007 | C | conf |
ISCAS
|
| 2007 | — | conf |
SBCCI
|
| 2006 | C | conf |
ISCAS
|
| 2005 | — | conf |
ICECS
|
| 2005 | — | conf |
ISCAS (3)
|
| 2004 | A | conf |
DATE
|
| 2004 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2003 | — | conf |
SBCCI
|
| 2002 | A | conf |
DATE
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2001 | A | conf |
DATE
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2001 | Misc | conf |
VTS
|
| 2001 | — | conf |
ISCAS (1)
|
| 2000 | A | conf |
DATE
|
| 2000 | — | conf |
LATW
|
| 2000 | — | conf |
PATMOS
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | C | conf |
ISCAS
|
| 1998 | J | jnl |
IEEE J. Solid State Circuits
|
| 1998 | A | conf |
DATE
|
| 1998 | — | conf |
ICECS
|
| 1998 | A | conf |
ITC
|
| 1997 | Misc | conf |
VTS
|
| 1997 | A* | conf |
SWITTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems.
DAC
|
| 1995 | A | conf |
ICCAD
|