Eduardas Bareisa

30 papers C 5Journal 15Unranked 10
YearRankTypeTitle / Venue / Authors
2022 J jnl
Automated Localization Testing of Mobile Applications Method.
Int. J. Softw. Eng. Knowl. Eng.
Sarunas Packevicius, Greta Rudzioniene, Eduardas Bareisa
2021 J jnl
Automated Visual Testing of Application User Interfaces Using Static Analysis of Screenshots.
Int. J. Softw. Eng. Knowl. Eng.
Sarunas Packevicius, Greta Rudzioniene, Eduardas Bareisa
2019 — conf
Directed Multi-target Search Based Unit Tests Generation.
ICIST
Greta Rudzioniene, Sarunas Packevicius, Eduardas Bareisa
2018 J jnl
Black box delay fault models for non-scan sequential circuits.
Comput. Sci. Inf. Syst.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Liudas Motiejunas, Rimantas Seinauskas
2018 — conf
Text Semantics and Layout Defects Detection in Android Apps Using Dynamic Execution and Screenshot Analysis.
ICIST
Sarunas Packevicius, Dominykas Barisas, Andrej Usaniov, Evaldas Guogis, Eduardas Bareisa
2017 — conf
The Study of Gender Equality in Information Sciences Research Institutions in Lithuania.
ICIST
Virginija Limanauskiene, Danguole Rutkauskiene, Vitalija Kersiene, Eduardas Bareisa, Robertas Damasevicius, Rytis Maskeliunas, Aleksandras Targamadze
2015 J jnl
Path delay test generation at functional level.
IET Comput. Digit. Tech.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2015 — conf
The Testing Method Based on Image Analysis for Automated Detection of UI Defects Intended for Mobile Applications.
ICIST
Sarunas Packevicius, Andrej Usaniov, Sarunas Stanskis, Eduardas Bareisa
2013 — conf
Automated Method for Software Integration Testing Based on UML Behavioral Models.
ICIST
Dominykas Barisas, Eduardas Bareisa, Sarunas Packevicius
2013 J jnl
Delay fault testing using partial multiple scan chains.
Microelectron. Reliab.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2013 J jnl
Functional delay test generation approach using a software prototype of the circuit.
Comput. Sci. Inf. Syst.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2012 — conf
Distributed System Automated Testing Design.
ICIST
Robertas Jasaitis, Eduardas Bareisa
2012 J jnl
Evaluation of testability enhancement using software prototype.
IET Comput. Digit. Tech.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2012 — conf
Generating Test Data Using Symbolic Execution: Challenges with Floating Point Data Types.
ICIST
Justinas Prelgauskas, Eduardas Bareisa
2011 J jnl
Functional fault models for non-scan sequential circuits.
Microelectron. Reliab.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2009 J jnl
A Formation Method of Flexible Learning Objects.
Informatics Educ.
Ramunas Kubiliunas, Eduardas Bareisa
2009 J jnl
Functional delay test generation based on software prototype.
Microelectron. Reliab.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2008 C conf
Development of Functional Delay Tests.
DSD
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2008 — conf
Platform Independent Unit Tests Generator.
SCSS (2)
Sarunas Packevicius, Andrej Usaniov, Eduardas Bareisa
2008 J jnl
Test generation at the algorithm-level for gate-level fault coverage.
Microelectron. Reliab.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2007 J jnl
Functional Test Generation Based on Combined Random and Deterministic Search Methods.
Informatica
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2007 — conf
Research and development of teaching software engineering processes.
CompSysTech
Eduardas Bareisa, Eimutis Karciauskas, Eugenijus Macikenas, Kestutis Motiejunas
2007 — conf
Software testing using imprecise OCL constraints as oracles.
CompSysTech
Sarunas Packevicius, Andrej Usaniov, Eduardas Bareisa
2007 C conf
The Criteria of Functional Delay Test Quality Assessment.
DSD
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2007 C conf
Transition Faults Testing Based on Functional Delay Tests.
DDECS
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2006 C conf
Transition Fault Test Reuse.
DSD
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2005 C conf
Functional Test Generation Remote Tool.
DSD
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2005 J jnl
The Realization-Independent Testing Based on the Black Box Fault Models.
Informatica
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2004 J jnl
Modernization of Information Technologies Studies at University Level.
Informatics Educ.
Juozas Adomavicius, Eduardas Bareisa, Vitalija Kersiene, Vitolis Sekliuckis
2003 J jnl
Identifying Legal and Illegal States in Synchronous Sequential Circuits Using Test Generation.
Informatica
Eduardas Bareisa, Kestutis Motiejunas, Rimantas Seinauskas