Edgar E. Sánchez

13 papers B 2C 2Journal 2Unranked 7
YearRankTypeTitle / Venue / Authors
2023 — conf
A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections.
LATS
G. Govarini, Annachiara Ruospo, Edgar E. Sánchez
2014 J jnl
A Functional Approach for Testing the Reorder Buffer Memory.
J. Electron. Test.
Stefano Di Carlo, Marco Gaudesi, Edgar E. Sánchez, Matteo Sonza Reorda
2010 B conf
A software-based self-test methodology for system peripherals.
ETS
Michelangelo Grosso, Wilson J. Pérez H., Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda, Jaime Velasco-Medina
2010 J jnl
Microprocessor Software-Based Self-Testing.
IEEE Des. Test Comput.
Mihalis Psarakis, Dimitris Gizopoulos, Edgar E. Sánchez, Matteo Sonza Reorda
2009 B conf
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization.
ETS
Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda
2009 — conf
Design validation of multithreaded architectures using concurrent threads evolution.
SBCCI
Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda, Giovanni Squillero
2009 — conf
On the Generation of Functional Test Programs for the Cache Replacement Logic.
Asian Test Symposium
Wilson J. Pérez H., Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda, Alberto Paolo Tonda
2008 C conf
A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs.
IOLTS
Wilson J. Pérez H., Jaime Velasco-Medina, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda
2008 C conf
Software-Based Self-Test Strategy for Data Cache Memories Embedded in SoCs.
DDECS
Wilson J. Pérez H., Jaime Velasco-Medina, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda
2007 — conf
A software-based methodology for the generation of peripheral test sets based on high-level descriptions.
SBCCI
Letícia Maria Veiras Bolzani, Edgar E. Sánchez, Matteo Sonza Reorda
2007 — conf
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains.
DFT
Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda
2007 — conf
Automotive Microcontroller End-of-Line Test via Software-Based Methodologies.
MTV
W. Di Palma, Danilo Ravotto, Edgar E. Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero
2007 — conf
On Automatic Test Block Generation for Peripheral Testing in SoCs via Dynamic FSMs Extraction.
MTV
Danilo Ravotto, Edgar E. Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero