Du-Ming Tsai

75 papers B 2Misc 2Journal 64Unranked 7
YearRankTypeTitle / Venue / Authors
2024 J jnl
Accurate Vision-Based PCB Positioning Using Cosine-Convolutional Neural Networks.
IEEE Trans Autom. Sci. Eng.
Carlos Solorzano, Du-Ming Tsai
2022 J jnl
Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Chun-Wei Cheng, Du-Ming Tsai
2022 J jnl
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Mabel C. Chou, Chih-Hung Jen, Jen-Hsuan Tsou
2021 J jnl
Auto-Annotated Deep Segmentation for Surface Defect Detection.
IEEE Trans. Instrum. Meas.
Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou
2021 J jnl
Autoencoder-based anomaly detection for surface defect inspection.
Adv. Eng. Informatics
Du-Ming Tsai, Po-Hao Jen
2020 J jnl
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fei He, Chun-Chung Cheng
2020 J jnl
Fast and Precise Positioning in PCBs Using Deep Neural Network Regression.
IEEE Trans. Instrum. Meas.
Du-Ming Tsai, Yi-Hsiang Chou
2019 — conf
Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification.
VISIGRAPP (5: VISAPP)
Du-Ming Tsai, Morris S. K. Fan, Yi-Quan Huang, Wei-Yao Chiu
2017 J jnl
Coffee plantation area recognition in satellite images using Fourier transform.
Comput. Electron. Agric.
Du-Ming Tsai, Wan-Ling Chen
2017 J jnl
Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique.
IEEE Trans. Instrum. Meas.
Du-Ming Tsai, Yi-Chun Hsieh
2015 J jnl
Defect detection in multi-crystal solar cells using clustering with uniformity measures.
Adv. Eng. Informatics
Du-Ming Tsai, Guan-Nan Li, Wei-Chen Li, Wei-Yao Chiu
2015 — conf
Moving object detection from a mobile robot using basis image matching.
Intelligent Robots and Computer Vision: Algorithms and Techniques
Du-Ming Tsai, Wei-Yao Chiu, Tzu-Hsun Tseng
2015 J jnl
Optical flow-motion history image (OF-MHI) for action recognition.
Signal Image Video Process.
Du-Ming Tsai, Wei-Yao Chiu, Men-Han Lee
2015 Misc conf
Surface defect detection in low-contrast images using basis image representation.
MVA
Du-Ming Tsai, Yan-Hsin Tseng, Wei-Yao Chiu
2014 J jnl
3-D vision-assist guidance for robots or the visually impaired.
Ind. Robot
Du-Ming Tsai, Hao Hsu, Wei-Yao Chiu
2014 J jnl
Dual-mode detection for foreground segmentation in low-contrast video images.
J. Real Time Image Process.
Wei-Yao Chiu, Du-Ming Tsai
2013 Misc conf
A real-time ICA-based activity recognition in video sequences.
MVA
Du-Ming Tsai, Wei-Yao Chiu
2013 J jnl
A template reconstruction scheme for moving object detection from a mobile robot.
Ind. Robot
Du-Ming Tsai, Tzu-Hsun Tseng
2013 J jnl
Defect Detection in Solar Modules Using ICA Basis Images.
IEEE Trans. Ind. Informatics
Du-Ming Tsai, Shih-Chieh Wu, Wei-Yao Chiu
2013 — conf
Dual-mode Detection for Foreground Segmentation in Low-contrast Video Images.
VISAPP (1)
Du-Ming Tsai, Wei-Yao Chiu
2012 J jnl
A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection.
IEEE Trans. Ind. Informatics
Du-Ming Tsai, I-Yung Chiang, Ya-Hui Tsai
2012 J jnl
A fast regularity measure for surface defect detection.
Mach. Vis. Appl.
Du-Ming Tsai, Ming-Chun Chen, Wei-Chen Li, Wei-Yao Chiu
2012 — conf
ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds.
GRAPP/IVAPP
Wei-Yao Chiu, Du-Ming Tsai
2012 J jnl
Wavelet-based defect detection in solar wafer images with inhomogeneous texture.
Pattern Recognit.
Wei-Chen Li, Du-Ming Tsai
2011 J jnl
Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection.
IEEE Trans. Ind. Informatics
Wei-Chen Li, Du-Ming Tsai
2011 J jnl
Fuzzy C-means based clustering for linearly and nonlinearly separable data.
Pattern Recognit.
Du-Ming Tsai, Chung-Chan Lin
2011 J jnl
Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis.
Mach. Vis. Appl.
Du-Ming Tsai, Hsin-Yang Tsai
2011 J jnl
Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces.
IEEE Trans. Ind. Informatics
Du-Ming Tsai, Jie-Yu Luo
2011 J jnl
Surface defect detection of 3D objects using robot vision.
Ind. Robot
Ya-Hui Tsai, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu, Ming-Chin Lin
2010 B conf
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces.
ICPR
Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu
2010 J jnl
A Macro-Observation Scheme for Abnormal Event Detection in Daily-Life Video Sequences.
EURASIP J. Adv. Signal Process.
Wei-Yao Chiu, Du-Ming Tsai
2010 — conf
A Macro-observation Approach of Intelligence Video Surveillance for Real-Time Unusual Event Detection.
UIC/ATC Workshops
Du-Ming Tsai, Wei-Yao Chiu
2010 J jnl
An improved anisotropic diffusion model for detail- and edge-preserving smoothing.
Pattern Recognit. Lett.
Shin-Min Chao, Du-Ming Tsai
2010 J jnl
Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images.
Pattern Recognit.
Shin-Min Chao, Du-Ming Tsai
2010 B conf
Anisotropic diffusion-based detail-preserving smoothing for image restoration.
ICIP
Shin-Min Chao, Du-Ming Tsai, Wei-Yao Chiu, Wei-Chen Li
2010 J jnl
Defect detection of uneven brightness in low-contrast images using basis image representation.
Pattern Recognit.
Yan-Hsin Tseng, Du-Ming Tsai
2010 J jnl
Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion.
Image Vis. Comput.
Du-Ming Tsai, Chih-Chieh Chang, Shin-Min Chao
2009 J jnl
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations.
Mach. Vis. Appl.
Du-Ming Tsai, Su-Ta Chuang
2009 J jnl
Independent Component Analysis-Based Background Subtraction for Indoor Surveillance.
IEEE Trans. Image Process.
Du-Ming Tsai, Shia-Chih Lai
2008 J jnl
An anisotropic diffusion-based defect detection for low-contrast glass substrates.
Image Vis. Comput.
Shin-Min Chao, Du-Ming Tsai
2008 J jnl
Defect detection in periodically patterned surfaces using independent component analysis.
Pattern Recognit.
Du-Ming Tsai, Shia-Chih Lai
2008 J jnl
Independent component analysis-based defect detection in patterned liquid crystal display surfaces.
Image Vis. Comput.
Chi-Jie Lu, Du-Ming Tsai
2008 J jnl
Motion detection using Fourier image reconstruction.
Pattern Recognit. Lett.
Du-Ming Tsai, Wei-Yao Chiu
2007 J jnl
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction.
Mach. Vis. Appl.
Du-Ming Tsai, Chih-Chia Kuo
2006 J jnl
An independent component analysis-based filter design for defect detection in low-contrast surface images.
Pattern Recognit.
Du-Ming Tsai, Ping-Chieh Lin, Chi-Jie Lu
2006 J jnl
Astronomical image restoration using an improved anisotropic diffusion.
Pattern Recognit. Lett.
Shin-Min Chao, Du-Ming Tsai
2006 — conf
Defect detection in low-contrast glass substrates using anisotropic diffusion.
ICPR (1)
Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang
2006 — conf
Independent component analysis based filter design for defect detection in low-contrast textured images.
ICPR (2)
Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao, Chao-Hsuan Yen
2005 J jnl
A quantile-quantile plot based pattern matching for defect detection.
Pattern Recognit. Lett.
Du-Ming Tsai, Cheng-Hsiang Yang
2005 J jnl
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures.
Image Vis. Comput.
Du-Ming Tsai, Shin-Min Chao
2005 J jnl
An eigenvalue-based similarity measure and its application in defect detection.
Image Vis. Comput.
Du-Ming Tsai, Ron-Hwa Yang
2005 J jnl
Optimal multi-thresholding using a hybrid optimization approach.
Pattern Recognit. Lett.
Erwie Zahara, Shu-Kai S. Fan, Du-Ming Tsai
2003 J jnl
Automated surface inspection for statistical textures.
Image Vis. Comput.
Du-Ming Tsai, Tse-Yun Huang
2003 J jnl
Automatic band selection for wavelet reconstruction in the application of defect detection.
Image Vis. Comput.
Du-Ming Tsai, Cheng-Huei Chiang
2003 J jnl
Defect detection in textured surfaces using color ring-projection correlation.
Mach. Vis. Appl.
Du-Ming Tsai, Ya-Hui Tsai
2003 J jnl
Fast normalized cross correlation for defect detection.
Pattern Recognit. Lett.
Du-Ming Tsai, Chien-Ta Lin
2003 J jnl
The evaluation of normalized cross correlations for defect detection.
Pattern Recognit. Lett.
Du-Ming Tsai, Chien-Ta Lin, Jeng-Fung Chen
2002 J jnl
Rotation-invariant pattern matching using wavelet decomposition.
Pattern Recognit. Lett.
Du-Ming Tsai, Cheng-Huei Chiang
2002 J jnl
Rotation-invariant pattern matching with color ring-projection.
Pattern Recognit.
Du-Ming Tsai, Ya-Hui Tsai
2001 J jnl
Automatic surface inspection using wavelet reconstruction.
Pattern Recognit.
Du-Ming Tsai, Bo Hsiao
2001 J jnl
Optimal Gabor filter design for texture segmentation using stochastic optimization.
Image Vis. Comput.
Du-Ming Tsai, Song-Kuaw Wu, Mu-Chen Chen
1999 J jnl
A stochastic optimization approach for roundness measurement.
Pattern Recognit. Lett.
Mu-Chen Chen, Du-Ming Tsai, Hsien-Yu Tseng
1999 J jnl
Automated surface inspection for directional textures.
Image Vis. Comput.
Du-Ming Tsai, C.-Y. Hsieh
1999 J jnl
Boundary-based corner detection using eigenvalues of covariance matrices.
Pattern Recognit. Lett.
Du-Ming Tsai, Huei-Tse Hou, H.-J. Su
1999 J jnl
Surface roughness classification for castings.
Pattern Recognit.
Du-Ming Tsai, Chi-Fong Tseng
1998 J jnl
A moment-preserving approach for depth from defocus.
Pattern Recognit.
Du-Ming Tsai, Chin-Tun Lin
1998 J jnl
Segmenting focused objects in complex visual images.
Pattern Recognit. Lett.
Du-Ming Tsai, Hu-Jong Wang
1997 J jnl
An improved generalized Hough transform for the recognition of overlapping objects.
Image Vis. Comput.
Du-Ming Tsai
1997 J jnl
Boundary-based corner detection using neural networks.
Pattern Recognit.
Du-Ming Tsai
1996 J jnl
Use neural networks to determine matching order for recognizing overlapping objects.
Pattern Recognit. Lett.
Du-Ming Tsai, Tsai Ray-Yuan
1995 J jnl
A fast thresholding selection procedure for multimodal and unimodal histograms.
Pattern Recognit. Lett.
Du-Ming Tsai
1995 J jnl
A three-dimensional machine-vision approach for automatic robot programming.
J. Intell. Robotic Syst.
Du-Ming Tsai
1995 J jnl
Object recognition by a linear weight classifier.
Pattern Recognit. Lett.
Du-Ming Tsai, Ming-Fong Chen
1994 J jnl
Curve fitting approach for tangent angle and curvature measurements.
Pattern Recognit.
Du-Ming Tsai, Ming-Fong Chen
1992 J jnl
A fast histogram-clustering approach for multi-level thresholding.
Pattern Recognit. Lett.
Du-Ming Tsai, Ying-Hsiung Chen