Dragoljub Gagi Drmanac

12 papers A* 2A 7Misc 2Unranked 1
YearRankTypeTitle / Venue / Authors
2014 Misc conf
Innovative practices session 5C: Machine learning and data analysis in test.
VTS
Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee
2011 A conf
Forward prediction based on wafer sort data - A case study.
ITC
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2011 A conf
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.
DATE
Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
2011 Misc conf
Understanding customer returns from a test perspective.
VTS
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2011 A conf
Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study.
ITC
Dragoljub Gagi Drmanac, Michael Laisne
2010 — conf
A non-parametric approach to behavioral device modeling.
ISQED
Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang
2010 A* conf
Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch.
DAC
Nicholas Callegari, Dragoljub Gagi Drmanac, Li-C. Wang, Magdy S. Abadir
2010 A conf
Mining AC delay measurements for understanding speed-limiting paths.
ITC
Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja
2010 A conf
Online selection of effective functional test programs based on novelty detection.
ICCAD
Po-Hsien Chang, Dragoljub Gagi Drmanac, Li-C. Wang
2009 A conf
Minimizing outlier delay test cost in the presence of systematic variability.
ITC
Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir
2009 A* conf
Predicting variability in nanoscale lithography processes.
DAC
Dragoljub Gagi Drmanac, Frank Liu, Li-C. Wang
2008 A conf
A Study of Outlier Analysis Techniques for Delay Testing.
ITC
Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang