| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | J | jnl |
Discret. Event Dyn. Syst.
|
| 2021 | A* | conf |
ICRA
|
| 2021 | J | jnl |
Sensors
|
| 2020 | J | jnl |
Frontiers Comput. Sci.
|
| 2019 | — | conf |
APMS (2)
|
| 2019 | J | jnl |
J. Ind. Inf. Integr.
|
| 2019 | J | jnl |
J. Intell. Manuf.
|
| 2016 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | — | conf |
CASE
|
| 2013 | J | jnl |
Comput. Ind.
|
| 2013 | J | jnl |
Feature extraction, condition monitoring, and fault modeling in semiconductor manufacturing systems.
Comput. Ind.
|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2012 | J | jnl |
Appl. Intell.
|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
J. Intell. Manuf.
|
| 2010 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2010 | — | ch. |
Applications of Neural Networks in High Assurance Systems
|
| 2008 | J | jnl |
J. Intell. Manuf.
|
| 2008 | J | jnl |
IEEE Trans. Neural Networks
|
| 2007 | B | conf |
IJCNN
|
| 2007 | J | jnl |
Comput. Ind.
|
| 2006 | — | conf |
ISNN (2)
|
| 2006 | J | jnl |
Comput. Ind.
|
| 2006 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2003 | J | jnl |
Adv. Eng. Informatics
|
| 2000 | J | jnl |
IEEE Trans. Biomed. Eng.
|