Douglas C. Bossen

14 papers A* 1Journal 12Unranked 1
YearRankTypeTitle / Venue / Authors
2002 J jnl
Fault-tolerant design of the IBM pSeries 690 system using POWER4 processor technology.
IBM J. Res. Dev.
Douglas C. Bossen, Alongkorn Kitamorn, Kevin Reick, Michael S. Floyd
2002 J jnl
Power4 System Design for High Reliability.
IEEE Micro
Douglas C. Bossen, Joel M. Tendler, Kevin Reick
1992 J jnl
Fault-tolerance design of the IBM Enterprise System/9000 Type 9021 processors.
IBM J. Res. Dev.
C. L. (Jim) Chen, Nandakumar N. Tendolkar, Arthur J. Sutton, M. Y. (Ben) Hsiao, Douglas C. Bossen
1984 J jnl
Fault Alignment Exclusion for Memory Using Address Permutation.
IBM J. Res. Dev.
Douglas C. Bossen, Chin-Long Chen, M. Y. (Ben) Hsiao
1982 J jnl
Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage.
IBM J. Res. Dev.
Douglas C. Bossen, M. Y. (Ben) Hsiao
1980 J jnl
A System Solution to the Memory Soft Error Problem.
IBM J. Res. Dev.
Douglas C. Bossen, Mu Y. Hsiao
1978 J jnl
Measurement and Generation of Error Correcting Codes for Package Failures.
IEEE Trans. Computers
Douglas C. Bossen, Lih C. Chang, Chin-Long Chen
1975 J jnl
On some properties of self-reciprocal polynomials (Corresp.).
IEEE Trans. Inf. Theory
Se June Hong, Douglas C. Bossen
1975 J jnl
Orthogonal Latin Square Configuration for LSI Memory Yield and Reliability Enhancement.
IEEE Trans. Computers
Mu Y. Hsiao, Douglas C. Bossen
1974 J jnl
Authors' Reply
IEEE Trans. Computers
Douglas C. Bossen, Se June Hong
1971 J jnl
Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks.
IEEE Trans. Computers
Douglas C. Bossen, Se June Hong
1971 A* conf
Minimum test patterns for residue networks.
DAC
Douglas C. Bossen, Daniel L. Ostapko, Arvind M. Patel, Martin S. Schmookler
1970 — conf
Optimum test patterns for parity networks.
AFIPS Fall Joint Computing Conference
Douglas C. Bossen, Daniel L. Ostapko, Arvind M. Patel
1968 J jnl
Redundant Residue Polynomial Codes
Inf. Control.
Douglas C. Bossen, Stephen S. Yau