Donghee Son

15 papers Journal 9Unranked 6
YearRankTypeTitle / Venue / Authors
2022 J jnl
Quantitative Evaluation of Line-Edge Roughness in Various FinFET Structures: Bayesian Neural Network With Automatic Model Selection.
IEEE Access
Sangho Yu, Sang Min Won, Hyoung Won Baac, Donghee Son, Changhwan Shin
2022 J jnl
Strain-Dependent Photoacoustic Characteristics of Free-Standing Carbon-Nanocomposite Transmitters.
Sensors
Muhammad Faraz, Muhammad Awais Abbasi, Donghee Son, Changhwan Shin, Kyu-Tae Lee, Sang Min Won, Hyoung Won Baac
2021 — conf
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.
IRPS
Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae
2021 — conf
Noise Conditional Flow Model for Learning the Super-Resolution Space.
CVPR Workshops
Younggeun Kim, Donghee Son
2021 J jnl
Noise Conditional Flow Model for Learning the Super-Resolution Space.
CoRR
Younggeun Kim, Donghee Son
2019 — conf
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.
IRPS
Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok
2019 — conf
Fractal Residual Network and Solutions for Real Super-Resolution.
CVPR Workshops
Junhyung Kwak, Donghee Son
2019 — conf
NTIRE 2019 Challenge on Real Image Super-Resolution: Methods and Results.
CVPR Workshops
Jianrui Cai, Shuhang Gu, Radu Timofte, Lei Zhang, Xiao Liu, Yukang Ding, Dongliang He, Chao Li, Yi Fu, Shilei Wen, Ruicheng Feng, Jinjin Gu, Yu Qiao, Chao Dong, Dongwon Park, Se Young Chun, Sanghoon Yoon, Junhyung Kwak, Donghee Son, Syed Waqas Zamir, Aditya Arora, Salman H. Khan, Fahad Shahbaz Khan, Ling Shao, Zhengping Wei, Lei Liu, Hong Cai, Darui Li, Fujie Gao, Zheng Hui, Xiumei Wang, Xinbo Gao, Guoan Cheng, Ai Matsune, Qiuyu Li, Leilei Zhu, Huaijuan Zang, Shu Zhan, Yajun Qiu, Ruxin Wang, Jiawei Li, Yongcheng Jing, Mingli Song, Pengju Liu, Kai Zhang, Jingdong Liu, Jiye Liu, Hongzhi Zhang, Wangmeng Zuo, Wenyi Tang, Jing Liu, Youngjung Kim, Changyeop Shin, Minbeom Kim, Sungho Kim, Pablo Navarrete Michelini, Hanwen Liu, Dan Zhu, Xuan Xu, Xin Li, Furui Bai, Xiaopeng Sun, Lin Zha, Yuanfei Huang, Wen Lu, Yanpeng Cao, Du Chen, Zewei He, Anshun Sun, Siliang Tang, Hongfei Fan, Xiang Li, Guo Li, Wenjie Zhang, Yumei Zhang, Qingwen He, Jinghui Qin, Lishan Huang, Yukai Shi, Pengxu Wei, Wushao Wen, Liang Lin, Jun Yu, Guochen Xie, Mengyan Li, Rong Chen, Xiaotong Luo, Chen Hong, Yanyun Qu, Cuihua Li, Zhi-Song Liu, Li-Wen Wang, Chu-Tak Li, Can Zhao, Bowen Li, Chung-Chi Tsai, Shang-Chih Chuang, Joonhee Choi, Joonsoo Kim, Xiaoyun Jiang, Ze Pan, Qunbo Lv, Zheng Tan, Peidong He
2018 J jnl
Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress.
Microelectron. Reliab.
Yeohyeok Yun, Ji-Hoon Seo, Donghee Son, Bongkoo Kang
2018 J jnl
Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.
Microelectron. Reliab.
Yeohyeok Yun, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang
2018 — conf
Towards the Development of Bidirectional Peripheral Nerve Interface for Long-term Implantation.
CBS
HyungDal Park, Wonsuk Choi, Woohyun Jung, Ockchul Kim, Jun-Uk Chu, Donghee Son, Jong Woong Park, Jinseok Kim
2018 J jnl
Unified Cox model based multifactor dimensionality reduction method for gene-gene interaction analysis of the survival phenotype.
BioData Min.
Seungyeoun Lee, Donghee Son, Yongkang Kim, Wenbao Yu, Taesung Park
2016 J jnl
Channel width dependence of AC stress on bulk nMOSFETs.
Microelectron. Reliab.
Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang
2016 J jnl
Degradation of pMOSFETs due to hot electron induced punchthrough.
Microelectron. Reliab.
Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang
2013 J jnl
Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs.
Microelectron. Reliab.
Seonhaeng Lee, Cheolgyu Kim, Hyeokjin Kim, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang