Dominik Kasprowicz

11 papers C 3Journal 3Unranked 5
YearRankTypeTitle / Venue / Authors
2019 — conf
Semiconductor Device Parameter Extraction Based on I-V Measurements and Simulation.
MIXDES
Dominik Kasprowicz
2019 J jnl
Table-Based Model of a Dual-Gate Transistor for Statistical Circuit Simulation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dominik Kasprowicz
2017 — conf
Variability-aware table-based DC model of a dual-gate transistor.
MIXDES
Dominik Kasprowicz
2015 — conf
Channel charge model of a dual-gate junctionless transistor.
MIXDES
Dominik Kasprowicz
2014 J jnl
Methods for automated detection of plagiarism in integrated-circuit layouts.
Microelectron. J.
Dominik Kasprowicz, Hilekaan Wada
2013 — conf
Computer-aided detection of plagiarism in integrated-circuit layouts.
MIXDES
Dominik Kasprowicz, Hilekaan Wada
2013 C conf
VeSFET as an analog-circuit component.
DDECS
Dominik Kasprowicz, Bartosz Swacha
2009 C conf
Adder Circuits with Transistors using Independently Controlled Gates.
ISCAS
Marcus Weis, Andrzej Pfitzner, Dominik Kasprowicz, Rainer Emling, Wojciech Maly, Doris Schmitt-Landsiedel
2008 C conf
Is there always performance overhead for regular fabric?
ICCD
Yi-Wei Lin, Malgorzata Marek-Sadowska, Wojciech Maly, Andrzej Pfitzner, Dominik Kasprowicz
2003 J jnl
Improvement of integrated circuit testing reliability by using the defect based approach.
Microelectron. Reliab.
Dominik Kasprowicz, Witold A. Pleskacz
2001 — conf
CMOS Standard Cells Characterization for Defect Based Testing.
DFT
Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz