Dominik Erb

20 papers A 6B 1Misc 3Journal 4Unranked 5
YearRankTypeTitle / Venue / Authors
2018 A conf
Characterization of possibly detected faults by accurately computing their detection probability.
DATE
Jan Burchard, Dominik Erb, Bernd Becker
2018 J jnl
On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
2017 Misc conf
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model.
VLSID
Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker
2017 Misc conf
Efficient SAT-based generation of hazard-activated TSOF tests.
VTS
Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
2017 J jnl
Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG.
J. Electron. Test.
Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker
2017 — conf
Evaluating the effectiveness of D-chains in SAT-based ATPG.
LATS
Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker
2017 A conf
Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG.
DATE
Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker
2016 A conf
Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs.
DATE
Karsten Scheibler, Dominik Erb, Bernd Becker
2016 — conf
Applying Tailored Formal Methods to X-ATPG.
MBMV
Karsten Scheibler, Dominik Erb, Bernd Becker
2016 — conf
Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns.
ASP-DAC
Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
2016 — —
On the handling of uncertainty in test pattern generation.
Dominik Erb
2015 J jnl
Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
2015 B conf
Improving test pattern generation in presence of unknown values beyond restricted symbolic logic.
ETS
Karsten Scheibler, Dominik Erb, Bernd Becker
2015 Misc conf
Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects.
VTS
Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
2014 — conf
Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects.
ATS
Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
2014 A conf
Efficient SMT-based ATPG for interconnect open defects.
DATE
Dominik Erb, Karsten Scheibler, Matthias Sauer, Bernd Becker
2014 J jnl
Exact Logic and Fault Simulation in Presence of Unknowns.
ACM Trans. Design Autom. Electr. Syst.
Dominik Erb, Michael A. Kochte, Matthias Sauer, Stefan Hillebrecht, Tobias Schubert, Hans-Joachim Wunderlich, Bernd Becker
2014 A conf
Test pattern generation in presence of unknown values based on restricted symbolic logic.
ITC
Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
2013 — conf
Accurate Multi-cycle ATPG in Presence of X-Values.
Asian Test Symposium
Dominik Erb, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
2013 A conf
Accurate QBF-based test pattern generation in presence of unknown values.
DATE
Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker