Dirk Niggemeyer

13 papers A* 1A 4Misc 2Journal 3Unranked 3
YearRankTypeTitle / Venue / Authors
2004 J jnl
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing.
IEEE Trans. Computers
Dirk Niggemeyer, Elizabeth M. Rudnick
2003 J jnl
A data acquisition methodology for on-chip repair of embedded memories.
ACM Trans. Design Autom. Electr. Syst.
Dirk Niggemeyer, Elizabeth M. Rudnick
2001 Misc conf
Automatic Generation of Diagnostic March Tests.
VTS
Dirk Niggemeyer, Elizabeth M. Rudnick
2001 J jnl
Use of a field programmable gate array for education in manufacturing test and automatic test equipment.
IEEE Trans. Educ.
Dirk Niggemeyer, Kevin J. Stephano, Elizabeth M. Rudnick
2000 — conf
Diagnostic Testing of Embedded Memories Based on Output Tracing.
MTDT
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Redeker
2000 A conf
Diagnostic Testing of Embedded Memories Using BIST.
DATE
Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick
2000 — conf
Using GLFSRs for Pseudo-Random Memory BIST.
MTDT
Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk Niggemeyer
1999 A conf
Parametric Built-In Self-Test of VLSI Systems.
DATE
Dirk Niggemeyer, M. Rüffer
1999 — conf
Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM.
DFT
Markus Rudack, Dirk Niggemeyer
1998 A* conf
A Video Signal Processor for MIMD Multiprocessing.
DAC
Jörg Hilgenstock, Klaus Herrmann, Jan Otterstedt, Dirk Niggemeyer, Peter Pirsch
1998 A conf
Core Interconnect Testing Hazards.
DATE
Petra Nordholz, Hartmut Grabinski, Dieter Treytnar, Jan Otterstedt, Dirk Niggemeyer, Uwe Arz, T. W. Williams
1998 A conf
Detection of CMOS address decoder open faults with March and pseudo random memory tests.
ITC
Jan Otterstedt, Dirk Niggemeyer, T. W. Williams
1998 Misc conf
Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores.
VTS
Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams