Dipak Kumar Kole

22 papers C 1Misc 1Journal 7Unranked 13
YearRankTypeTitle / Venue / Authors
2024 J jnl
X-ResFormer: A Model to Detect Infestation of Pest and Diseases on Crops.
SN Comput. Sci.
Dhiman Mondal, Purbayan Kar, Kusal Roy, Dipak Kumar Kole, Swalpa Kumar Roy
2022 J jnl
DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits.
J. Circuits Syst. Comput.
Joyati Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh Kumar Das, Bhargab B. Bhattacharya
2022 J jnl
Deep Learning-Based Approach to Detect and Classify Signs of Crop Leaf Diseases and Pest Damage.
SN Comput. Sci.
Dhiman Mondal, Kusal Roy, Dibyarup Pal, Dipak Kumar Kole
2019 J jnl
Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits.
J. Circuits Syst. Comput.
Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh Kumar Das
2016 — conf
Generalized construction of quantum multiplexers and de-multiplexers using a proposed novel algorithm based on universal Fredkin gate.
ISED
Dipak Kumar Kole, Jhuma Dutta, Arpita Kundu, Suravi Chatterjee, Suravi Agarwal, Tanushri Kisku
2015 — conf
An Integrated Digital Image Analysis System for Detection, Recognition and Diagnosis of Disease in Wheat Leaves.
WCI
Diptesh Majumdar, Dipak Kumar Kole, Aruna Chakraborty, Dwijesh Dutta Majumder
2015 C conf
Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible Circuits.
DDECS
Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das
2014 J jnl
An Automated Group Key Authentication System Using Secret Image Sharing Scheme.
CoRR
Dipak Kumar Kole, Subhadip Basu
2014 — conf
Application of Fuzzy C-Means Clustering Method to Classify Wheat Leaf Images Based on the Presence of Rust Disease.
FICTA (1)
Diptesh Majumdar, Arya Ghosh, Dipak Kumar Kole, Aruna Chakraborty, Dwijesh Dutta Majumder
2014 — conf
Diagnosis of SMGF in ESOP Based Reversible Logic Circuit.
ISED
Bappaditya Mondal, Chandan Bandyopadhyay, Dipak Kumar Kole, Jimson Mathew, Hafizur Rahaman
2014 — conf
Generator for Test Set Construction of SMGF in Reversible Circuit by Boolean Difference Method.
ATS
Bappaditya Mondal, Dipak Kumar Kole, Debesh Kumar Das, Hafizur Rahaman
2013 — conf
A design for testability technique for quantum reversible circuits.
EWDTS
Joyati Mondal, Debesh K. Das, Dipak Kumar Kole, Hafizur Rahaman
2013 J jnl
Derivation of test set for detecting multiple missing-gate faults in reversible circuits.
Comput. Electr. Eng.
Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya
2013 — conf
ESOP-Based Synthesis of Reversible Circuit Using Improved Cube List.
ISED
Chandan Bandyopadhyay, Debashri Roy, Dipak Kumar Kole, Kamalika Datta, Hafizur Rahaman
2013 — conf
On Designing Testable Reversible Circuits Using Gate Duplication.
VDAT
Joyati Mondal, Debesh Kumar Das, Dipak Kumar Kole, Hafizur Rahaman, Bhargab B. Bhattacharya
2012 — conf
Enhancing the security of digital Video Watermarking using watermark encryption.
CCSEIT
Ujan Mukhopadhyay, Souptik Sinha, Poulomi Ghosh, Rilok Ghosh, Dipak Kumar Kole, Aruna Chakraborty
2012 — conf
Reversible Logic Circuit Synthesis Using Genetic Algorithm and Particle Swarm Optimization.
ISED
Papia Manna, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya
2011 — conf
Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits.
ISED
Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya
2011 J jnl
Fault diagnosis in reversible circuits under missing-gate fault model.
Comput. Electr. Eng.
Hafizur Rahaman, Dipak Kumar Kole, Debesh K. Das, Bhargab B. Bhattacharya
2010 — conf
Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits.
Asian Test Symposium
Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya
2008 Misc conf
On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set.
VLSI Design
Hafizur Rahaman, Dipak Kumar Kole, Debesh Kumar Das, Bhargab B. Bhattacharya
2007 — conf
Optimum Test Set for Bridging Fault Detection in Reversible Circuits.
ATS
Hafizur Rahaman, Dipak Kumar Kole, Debesh K. Das, Bhargab B. Bhattacharya