Dionyz Pogany

38 papers Journal 34Unranked 4
YearRankTypeTitle / Venue / Authors
2025 — conf
Evidence for 2D Hole Gas in GaN Gate Injection Transistors and its Role in RDson Recovery.
IRPS
Bernhard Ruch, Rajarshi Roy Chaudhuri, Boris Butej, Joao Gomes, Manuel Stabentheiner, Korbinian Reiser, Christian Koller, Dionyz Pogany, Clemens Ostermaier, Michael Waltl
2023 — conf
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.
IRPS
D. Wieland, Sybille Ofner, Manuel Stabentheiner, Boris Butej, Christian Koller, J. Sun, Andrea Minetto, Korbinian Reiser, Oliver Häberlen, Michael Nelhiebel, Michael Glavanovics, Dionyz Pogany, Clemens Ostermaier
2018 J jnl
Review of bias-temperature instabilities at the III-N/dielectric interface.
Microelectron. Reliab.
Clemens Ostermaier, Peter Lagger, M. Reiner, Dionyz Pogany
2017 J jnl
TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs.
Microelectron. Reliab.
Clément Fleury, Guido Notermans, Hans-Martin Ritter, Dionyz Pogany
2016 J jnl
Normally-off GaN-HEMTs with p-type gate: Off-state degradation, forward gate stress and ESD failure.
Microelectron. Reliab.
Matteo Meneghini, Oliver Hilt, Clément Fleury, Riccardo Silvestri, Mattia Capriotti, Gottfried Strasser, Dionyz Pogany, Eldad Bahat-Treidel, Frank Brunner, A. Knauer, Joachim Würfl, Isabella Rossetto, Enrico Zanoni, Gaudenzio Meneghesso, Stefano Dalcanale
2015 — conf
E-mode AlGaN/GaN True-MOS, with high-k ZrO2 gate insulator.
ESSDERC
Mattia Capriotti, Clément Fleury, Ole Bethge, Matteo Rigato, Suzanne Lancaster, Dionyz Pogany, Gottfried Strasser, Eldad Bahat-Treidel, Oliver Hilt, Frank Brunner, Joachim Würfl
2015 J jnl
ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique.
Microelectron. Reliab.
Matteo Rigato, Clément Fleury, Michael Heer, Mattia Capriotti, Werner Simbürger, Dionyz Pogany
2015 J jnl
High temperature performances of normally-off p-GaN gate AlGaN/GaN HEMTs on SiC and Si substrates for power applications.
Microelectron. Reliab.
Clément Fleury, Mattia Capriotti, Matteo Rigato, Oliver Hilt, Joachim Würfl, Joff Derluyn, Stephan Steinhauer, Anton Köck, Gottfried Strasser, Dionyz Pogany
2015 — conf
Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters.
IRPS
Peter Lagger, S. Donsa, P. Spreitzer, Gregor Pobegen, M. Reiner, H. Naharashi, J. Mohamed, H. Mosslacher, G. Prechtl, Dionyz Pogany, Clemens Ostermaier
2013 J jnl
Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications.
Microelectron. Reliab.
Clément Fleury, Rimma Zhytnytska, Sergey Bychikhin, Mattia Capriotti, Oliver Hilt, Domenica Visalli, Gaudenzio Meneghesso, Enrico Zanoni, Joachim Würfl, Joff Derluyn, Gottfried Strasser, Dionyz Pogany
2012 J jnl
Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS
Microelectron. J.
J. Rhayem, B. Besbes, Raul Blecic, Sergey Bychikhin, Georg Haberfehlner, Dionyz Pogany, B. Desoete, Renaud Gillon, Aarnout Wieers, Marnix Tack
2012 J jnl
HMM-TLP correlation for system-efficient ESD design.
Microelectron. Reliab.
Guido Notermans, Sergey Bychikhin, Dionyz Pogany, David Johnsson, Dejan M. Maksimovic
2012 J jnl
IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab.
Paul Marko, Matteo Meneghini, Sergey Bychikhin, Denis Marcon, Gaudenzio Meneghesso, Enrico Zanoni, Dionyz Pogany
2012 J jnl
Reliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structure.
Microelectron. Reliab.
Clemens Ostermaier, Peter Lagger, Mohammed Alomari, Patrick Herfurth, David Maier, Alexander Alexewicz, Marie-Antoinette di Forte-Poisson, Sylvain L. Delage, Gottfried Strasser, Dionyz Pogany, Erhard Kohn
2011 J jnl
Application of transient interferometric mapping method for ESD and latch-up analysis.
Microelectron. Reliab.
Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik
2011 J jnl
Improved thermal management of low voltage power devices with optimized bond wire positions.
Microelectron. Reliab.
Helmut Köck, Christian Djelassi, Stefano de Filippis, Robert Illing, Michael Nelhiebel, Markus Ladurner, Michael Glavanovics, Dionyz Pogany
2010 J jnl
Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation.
Microelectron. Reliab.
Sergey Bychikhin, Georg Haberfehlner, J. Rhayem, Daniel Vanderstraeten, Renaud Gillon, Dionyz Pogany
2010 J jnl
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.
Microelectron. Reliab.
A. Podgaynaya, Ralf Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, Marc Strasser
2009 J jnl
IR thermography and FEM simulation analysis of on-chip temperature during thermal-cycling power-metal reliability testing using in situ heated structures.
Microelectron. Reliab.
Helmut Köck, Vladimír Kosel, Christian Djelassi, Michael Glavanovics, Dionyz Pogany
2009 J jnl
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Microelectron. Reliab.
Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany
2009 J jnl
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.
Microelectron. Reliab.
Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler
2008 J jnl
Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications.
Microelectron. Reliab.
Michael Heer, P. Grombach, A. Heid, Dionyz Pogany
2007 J jnl
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler
2007 J jnl
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.
Microelectron. Reliab.
Michael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, Winfried Soppa, Bernd Ramler
2007 J jnl
Optimization and performance of Al
Microelectron. Reliab.
Karol Cico, Ján Kuzmík, Dagmar Gregusová, Roman Stoklas, Tibor Lalinsky, Alexandros G. Georgakilas, Dionyz Pogany, Karol Fröhlich
2007 J jnl
Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping.
Microelectron. Reliab.
Sergey Bychikhin, T. Swietlik, Tadeusz Suski, Sylwester Porowski, Piotr Perlin, Dionyz Pogany
2006 J jnl
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectron. Reliab.
Michael Heer, Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz
2005 J jnl
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectron. Reliab.
Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos
2005 J jnl
Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices.
IEEE Trans. Instrum. Meas.
Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik
2004 J jnl
Multiple-time-instant 2D thermal mapping during a single ESD event.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik
2004 J jnl
Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress.
Microelectron. Reliab.
Sergey Bychikhin, Viktor Dubec, Dionyz Pogany, Erich Gornik, M. Graf, V. Dudek, Winfried Soppa
2003 J jnl
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, Ning Qu, Wolfgang Wilkening, L. Zullino, A. Andreini
2003 J jnl
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.
Microelectron. Reliab.
M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher
2002 J jnl
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.
Microelectron. Reliab.
Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik
2002 J jnl
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.
Microelectron. Reliab.
Dionyz Pogany, Ján Kuzmík, Juraj Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik
2002 J jnl
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions.
Microelectron. Reliab.
M. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, Erich Gornik
2001 J jnl
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectron. Reliab.
Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner
2001 J jnl
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectron. Reliab.
Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher