Dimitris K. Papakostas

12 papers C 4Journal 5Unranked 3
YearRankTypeTitle / Venue / Authors
2010 J jnl
Circuit Implementation of a Supply Current Spectrum Test Method.
IEEE Trans. Instrum. Meas.
Michael G. Dimopoulos, Alexios Spyronasios, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alkis A. Hatzopoulos
2010 J jnl
Improved analogue fault coverage estimation using probabilistic analysis.
Int. J. Circuit Theory Appl.
Dimitris K. Papakostas, Alkis A. Hatzopoulos
2010 C conf
Wavelet analysis of current measurements for mixed-signal circuit testing.
ISCAS
Michael G. Dimopoulos, Dimitris K. Papakostas, Basilios D. Vassios, Alkis A. Hatzopoulos
2008 J jnl
A Unified Procedure for Fault Detection of Analog and Mixed-Mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum.
IEEE Trans. Instrum. Meas.
Dimitris K. Papakostas, Alkis A. Hatzopoulos
2008 — conf
Power supply current testing in the production line of emergency luminaire circuits.
ICECS
Michael G. Dimopoulos, Dimitris K. Papakostas, Alexios Spyronasios, Alkis A. Hatzopoulos, Dimitrios K. Konstantinou
2008 C conf
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach.
DDECS
Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Alexios Spyronasios
2007 — conf
Design and development of a versatile testing system for analog and mixed-signal circuits.
ECCTD
Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Evdokimos I. Konstantinidis, Alexios Spyronasios
2007 — conf
Multiple Parametric Circuit Analysis Tool for Detectability Estimation.
ICECS
Michael G. Dimopoulos, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alexios Spyronasios, Alkis A. Hatzopoulos
2006 C conf
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.
ISCAS
Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos
2006 J jnl
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.
Microelectron. J.
Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos
2003 J jnl
Estimation of circuit output measurements including statistically dependent parameters.
Int. J. Circuit Theory Appl.
Dimitris K. Papakostas, Alkis A. Hatzopoulos
1994 C conf
Fault Detection in Linear Bipolar ICs: Comparative Results Between Power Supply Current and Output Voltage Measurements.
ISCAS
Dimitris K. Papakostas, Alkis A. Hatzopoulos