Dimitrios Kagaris

46 papers A* 1A 2B 1C 8Misc 3Journal 23Unranked 8
YearRankTypeTitle / Venue / Authors
2009 J jnl
An Improved Search Method for Accumulator-Based Test Set Embedding.
IEEE Trans. Computers
Dimitris Nikolos, Dimitrios Kagaris, Samara Sudireddy, Spyros Gidaros
2008 J jnl
Evaluation of Generalized LFSRs as Test Pattern Generators in Two-Dimensional Scan Designs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jayawant Kakade, Dimitrios Kagaris, Dhiraj K. Pradhan
2007 J jnl
A Methodology for Transistor-Efficient Supergate Design.
IEEE Trans. Very Large Scale Integr. Syst.
Dimitrios Kagaris, Themistoklis Haniotakis
2007 — conf
Detecting VLIW Hard Errors Cost-Effectively through a Software-Based Approach.
AINA Workshops (1)
Abhishek Pillai, Wei Zhang, Dimitrios Kagaris
2007 J jnl
Minimization of Linear Dependencies Through the Use of Phase Shifters.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jayawant Kakade, Dimitrios Kagaris
2006 C conf
Diophantine-Equation Based Arithmetic Test Set Embedding.
IOLTS
Dimitris Nikolos, Dimitrios Kagaris, Spyros Gidaros
2006 J jnl
On Obtaining Maximum-Length Sequences for Accumulator-Based Serial TPG.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dimitrios Kagaris, P. Karpodinis, Dimitris Nikolos
2006 C conf
Phase shifts and linear dependencies.
ISCAS
Jayawant Kakade, Dimitrios Kagaris
2006 J jnl
Throughput performance of an adaptive ARQ scheme in Rayleigh fading channels.
IEEE Trans. Wirel. Commun.
Anil Mehta, Dimitrios Kagaris, R. Viswanathan
2005 J jnl
A unified method for phase shifter computation.
ACM Trans. Design Autom. Electr. Syst.
Dimitrios Kagaris
2005 A conf
Comparative study of CA with phase shifters and GLFSRs.
ITC
S. Chidambaram, Dimitrios Kagaris, Dhiraj K. Pradhan
2002 J jnl
Linear dependencies in extended LFSMs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dimitrios Kagaris
2002 J jnl
On the nonenumerative path delay fault simulation problem.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dimitrios Kagaris, Spyros Tragoudas
2002 Misc conf
Test Set Embedding Based on Phase Shifters.
EDCC
Maciej Bellos, Dimitrios Kagaris, Dimitris Nikolos
2002 J jnl
Using a WLFSR to Embed Test Pattern Pairs in Minimum Time.
J. Electron. Test.
Dimitrios Kagaris, Spyros Tragoudas
2001 J jnl
Computational analysis of counter-based schemes for VLSI test pattern generation.
Discret. Appl. Math.
Dimitrios Kagaris, Spyros Tragoudas
2001 J jnl
Von Neumann hybrid cellular automata for generating deterministic test sequences.
ACM Trans. Design Autom. Electr. Syst.
Dimitrios Kagaris, Spyros Tragoudas
2000 C conf
Pseudoexhaustive TPG with a Provably Low Number of LFSR Seeds.
ICCD
Dimitrios Kagaris, Spyros Tragoudas
1999 — conf
Embedded cores using built-in mechanisms.
ISCAS (1)
Dimitrios Kagaris, Spyros Tragoudas
1999 — conf
LFSR/SR Pseudo-Exhaustive TPG in Fewer Test Cycles.
DFT
Dimitrios Kagaris, Spyros Tragoudas
1999 J jnl
On the design of optimal counter-based schemes for test set embedding.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dimitrios Kagaris, Spyros Tragoudas
1999 J jnl
Transmissions in a network with capacities and delays.
Networks
Dimitrios Kagaris, Grammati E. Pantziou, Spyros Tragoudas, Christos D. Zaroliagis
1998 — conf
On-Chip Test Embedding for Multi-Weighted Random LFSRs.
DFT
Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar
1997 J jnl
A routing algorithm for row-based FPGAs.
Microprocess. Microsystems
Dimitrios Kagaris
1997 — conf
Cellular automata for generating deterministic test sequences.
ED&TC
Dimitrios Kagaris, Spyros Tragoudas
1997 J jnl
Improved nonenumerative path-delay fault-coverage estimation based on optimal polynomial-time algorithms.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dimitrios Kagaris, Spyros Tragoudas, Dimitrios Karayiannis
1997 A conf
Maximum independent sets on transitive graphs and their applications in testing and CAD.
ICCAD
Dimitrios Kagaris, Spyros Tragoudas
1997 C conf
Nonenumerative Path Delay Fault Coverage Estimation with Optimal Algorithms.
ICCD
Dimitrios Kagaris, Spyros Tragoudas, Dimitrios Karayiannis
1996 J jnl
A fast algorithm for minimizing FPGA combinational and sequential modules.
ACM Trans. Design Autom. Electr. Syst.
Dimitrios Kagaris, Spyros Tragoudas
1996 C conf
A multiseed counter TPG with performance guarantee.
ICCD
Dimitrios Kagaris, Spyros Tragoudas
1996 — conf
Deterministic Test Pattern Reproduction by a Counter.
ED&TC
Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar
1996 Misc conf
Generating deterministic unordered test patterns with counters.
VTS
Dimitrios Kagaris, Spyros Tragoudas
1996 J jnl
On the Use of Counters for Reproducing Deterministic Test Sets.
IEEE Trans. Computers
Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar
1996 J jnl
Retiming-Based Partial Scan.
IEEE Trans. Computers
Dimitrios Kagaris, Spyros Tragoudas
1995 J jnl
Avoiding linear dependencies in LFSR test pattern generators.
J. Electron. Test.
Dimitrios Kagaris, Spyros Tragoudas
1995 B conf
On the Computation of Fast Data Transmissions in Networks with Capacities and Delays.
WADS
Dimitrios Kagaris, Spyros Tragoudas, Grammati E. Pantziou, Christos D. Zaroliagis
1995 J jnl
Pseudo-exhaustive built-in TPG for sequential circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dimitrios Kagaris, Spyros Tragoudas, Dinesh Bhatia
1995 — conf
Quickest paths: parallelization and dynamization .
HICSS (2)
Dimitrios Kagaris, Spyros Tragoudas, Grammati E. Pantziou, Christos D. Zaroliagis
1994 C conf
A Class of Good Characteristics Polynomials for LFSR Test Pattern Generators.
ICCD
Dimitrios Kagaris, Spyros Tragoudas
1994 Misc conf
A design for testability technique for test pattern generation with LFSRs.
VTS
Dimitrios Kagaris, Spyros Tragoudas
1994 J jnl
A method for pseudo-exhaustive test pattern generation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dimitrios Kagaris, Fillia Makedon, Spyros Tragoudas
1994 — conf
Retiming algorithms with application to VLSI testability.
Great Lakes Symposium on VLSI
Dimitrios Kagaris, Spyros Tragoudas
1993 J jnl
Cost-effective LFSR synthesis for optimal pseudoexhaustive BIST test sets.
IEEE Trans. Very Large Scale Integr. Syst.
Dimitrios Kagaris, Spyros Tragoudas
1993 A* conf
Partial Scan with Retiming.
DAC
Dimitrios Kagaris, Spyros Tragoudas
1993 C conf
Pseudoexhaustive BIST for Sequential Circuits.
ICCD
Dimitrios Kagaris, Spyros Tragoudas, Dinesh Bhatia
1992 C conf
On Minimizing Hardware Overhead for Pseudoexhaustive Circuit Testability.
ICCD
Dimitrios Kagaris, Fillia Makedon, Spyros Tragoudas