Diing Shenp Ang

14 papers Journal 11Unranked 3
YearRankTypeTitle / Venue / Authors
2022 J jnl
Hieroglyphically Supervised Bioinspired Visioneural Controller.
Adv. Intell. Syst.
Dan Berco, Chih-Hao Chiu, Diing Shenp Ang
2021 J jnl
Bioinspired Robotic Vision with Online Learning Capability and Rotation-Invariant Properties.
Adv. Intell. Syst.
Dan Berco, Diing Shenp Ang
2020 J jnl
Alteration of Gate-Oxide Trap Capture/Emission Time Constants by Channel Hot-Carrier Effect in the Metal-Oxide-Semiconductor Field-Effect Transistor.
IEEE Access
Xin Ju, Diing Shenp Ang
2020 J jnl
An Optoneuronic Device with Realistic Retinal Expressions for Bioinspired Machine Vision.
Adv. Intell. Syst.
Dan Berco, Diing Shenp Ang, Hai Zhong Zhang
2020 J jnl
An Optoneuronic Device with Realistic Retinal Expressions for Bioinspired Machine Vision.
Adv. Intell. Syst.
Dan Berco, Diing Shenp Ang, Hai Zhong Zhang
2020 — conf
Gate-Oxide Trapping Enabled Synaptic Logic Transistor.
IRPS
Xin Ju, Diing Shenp Ang
2020 J jnl
Highly Transparent ITO/HfO
IEEE Access
Pranav Sairam Kalaga, Dayanand Kumar, Diing Shenp Ang, Zviad Tsakadze
2020 J jnl
Programmable Photoelectric Memristor Gates for In Situ Image Compression.
Adv. Intell. Syst.
Dan Berco, Diing Shenp Ang, Pranav Sairam Kalaga
2020 J jnl
Programmable Photoelectric Memristor Gates for In Situ Image Compression.
Adv. Intell. Syst.
Dan Berco, Diing Shenp Ang, Pranav Sairam Kalaga
2019 J jnl
Recent Progress in Synaptic Devices Paving the Way toward an Artificial Cogni-Retina for Bionic and Machine Vision.
Adv. Intell. Syst.
Dan Berco, Diing Shenp Ang
2019 J jnl
Recent Progress in Synaptic Devices Paving the Way toward an Artificial Cogni-Retina for Bionic and Machine Vision.
Adv. Intell. Syst.
Dan Berco, Diing Shenp Ang
2019 — conf
Response of Switching Hole Traps in the Small-Area P-MOSFET Under Channel Hot-Hole Effect.
IRPS
Xin Ju, Diing Shenp Ang
2018 — conf
Oxide breakdown path for optical sensing at the nanoscale level.
IRPS
Yu Zhou, Diing Shenp Ang, Pranav Sairam Kalaga, Sankara Rao Gollu
2014 J jnl
Evolution of oxide charge trapping under bias temperature stressing.
Microelectron. Reliab.
Diing Shenp Ang, Chenjie Gu, Z. Y. Tung, A. A. Boo, Yuan Gao