Diganta Das

26 papers Journal 22Unranked 4
YearRankTypeTitle / Venue / Authors
2025 J jnl
Analysis of Standards-Based Counterfeit Microelectronics Detection Methods.
IEEE Access
Devon R. Richman, Michael H. Azarian, Diganta Das, Michael G. Pecht
2025 J jnl
Life Cycle Profile Development for Product Reliability Assessment.
Qual. Reliab. Eng. Int.
Abhishek Ram, Diganta Das
2025 J jnl
Using sociotechnical network modeling to analyze the impact of blockchain for supply chain on the risk of procuring counterfeit electronic parts.
Adv. Eng. Informatics
Hirbod Akhavantaheri, Peter Sandborn, Diganta Das
2024 J jnl
A Remote Control Painting System for Exterior Walls of High-Rise Buildings through Robotic System.
CoRR
Diganta Das, Dipanjali Kundu, Anichur Rahman, Muaz Rahman, Sadia Sazzad
2024 J jnl
Enhancing qualification via the use of diagnostics and prognostics techniques.
Qual. Reliab. Eng. Int.
Abhishek Ram, Diganta Das
2024 J jnl
Federated Deep Learning for Monkeypox Disease Detection on GAN-Augmented Dataset.
IEEE Access
Dipanjali Kundu, Md. Mahbubur Rahman, Anichur Rahman, Diganta Das, Umme Raihan Siddiqi, Md. Golam Rabiul Alam, Samrat Kumar Dey, Ghulam Muhammad, Zulfiqar Ali
2023 J jnl
One-fault-shot learning for fault severity estimation of gears that addresses differences between simulation and experimental signals and transfer function effects.
Adv. Eng. Informatics
Omri Matania, Lior Bachar, Varun Khemani, Diganta Das, Michael H. Azarian, Jacob Bortman
2021 J jnl
An Assessment of Validity of the Bathtub Model Hazard Rate Trends in Electronics.
IEEE Access
Aishwarya Gaonkar, Rajkumar B. Patil, San Kyeong, Diganta Das, Michael G. Pecht
2021 J jnl
Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors.
IEEE Access
Xiangxiang Liu, Tianlei Jiao, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht
2020 J jnl
Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor.
IEEE Access
Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht
2019 J jnl
ACA Curing Process Optimization Based on Curing Degree Considering Shear Strength of Joints.
IEEE Access
Guanghua Wu, Meixian Jiang, Diganta Das, Michael G. Pecht
2019 J jnl
Breaking the Trust: How Companies Are Failing Their Customers.
IEEE Access
Lidia Al-Zogbi, Diganta Das, Peter Rundle, Michael G. Pecht
2019 — conf
Evaluating Impact of Information Uncertainties on Component Reliability Assessment.
IRPS
Diganta Das, Edmond Elburn, Michael G. Pecht, Bhanu Sood
2018 J jnl
Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs).
Microelectron. Reliab.
Nga Man Li, Subramani Manoharan, Diganta Das, F. Patrick McCluskey
2016 J jnl
Thermal reliability prediction and analysis for high-density electronic systems based on the Markov process.
Microelectron. Reliab.
Yi Wan, Hailong Huang, Diganta Das, Michael G. Pecht
2015 J jnl
Anomaly detection for IGBTs using Mahalanobis distance.
Microelectron. Reliab.
Nishad Patil, Diganta Das, Michael G. Pecht
2014 J jnl
Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test.
IEEE Trans. Ind. Informatics
Moon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht
2013 J jnl
Long term storage reliability of antifuse field programmable gate arrays.
Microelectron. Reliab.
Nishad Patil, Diganta Das, Estelle Scanff, Michael G. Pecht
2012 J jnl
A prognostic approach for non-punch through and field stop IGBTs.
Microelectron. Reliab.
Nishad Patil, Diganta Das, Michael G. Pecht
2012 J jnl
Light emitting diodes reliability review.
Microelectron. Reliab.
Moon-Hwan Chang, Diganta Das, Prabhakar V. Varde, Michael G. Pecht
2011 — conf
Prognostics-based health management for telecom equipment under free air cooling.
EUROCON
Jun Dai, Diganta Das, Michael G. Pecht
2011 — conf
Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event Investigations.
ICBO
Shunfeng Cheng, Diganta Das, Michael G. Pecht
2010 — conf
Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics.
CE
Nishad Patil, Diganta Das, Michael G. Pecht
2009 J jnl
Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics.
IEEE Trans. Reliab.
Nishad Patil, Jose Celaya, Diganta Das, Kai Goebel, Michael G. Pecht
2002 J jnl
The IEEE standards on reliability program and reliability prediction methods for electronic equipment.
Microelectron. Reliab.
Michael G. Pecht, Diganta Das, Arun Ramakrishnan
1996 J jnl
Generating redesign suggestions to reduce setup cost: a step towards automated redesign.
Comput. Aided Des.
Diganta Das, Satyandra K. Gupta, Dana S. Nau