| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2023 | — | conf |
LASCAS
|
| 2013 | — | conf |
LASCAS
|
| 2013 | — | conf |
LASCAS
|
| 2011 | — | conf |
ECCTD
|
| 2011 | — | conf |
ESSCIRC
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2010 | C | conf |
DDECS
|
| 2010 | B | conf |
ETS
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2008 | — | conf |
APCCAS
|
| 2008 | — | conf |
SBCCI
|
| 2008 | A | conf |
DATE
|
| 2006 | C | conf |
DDECS
|
| 2005 | J | jnl |
Microelectron. J.
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | J | jnl |
Microelectron. J.
|
| 2004 | A | conf |
DATE
|
| 2003 | J | jnl |
Microelectron. J.
|
| 2002 | — | conf |
ICECS
|
| 2002 | — | conf |
LATW
|
| 2002 | — | conf |
DELTA
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | Misc | conf |
VTS
|
| 2002 | — | conf |
Practical solutions for the application of the oscillation-based-test in analog integrated circuits.
ISCAS (1)
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2001 | — | conf |
ICECS
|
| 2000 | Misc | conf |
VLSI Design
|
| 2000 | — | conf |
Asian Test Symposium
|
| 1999 | A | conf |
ITC
|
| 1998 | J | jnl |
IEEE J. Solid State Circuits
|
| 1998 | A | conf |
DATE
|
| 1996 | Misc | conf |
VTS
|
| 1995 | Misc | conf |
VTS
|
| 1994 | C | conf |
ISCAS
|
| 1994 | Misc | conf |
VTS
|
| 1993 | J | jnl |
J. Electron. Test.
|
| 1993 | J | jnl |
IEEE J. Solid State Circuits
|
| 1992 | Misc | conf |
VTS
|