Diego Mateo

39 papers A 4B 1C 7Misc 1Journal 14Unranked 12
YearRankTypeTitle / Venue / Authors
2023 J jnl
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements.
Sensors
Josep Altet, Xavier Aragonès, Enrique Barajas, Xavier Gisbert, Sergio Martínez, Diego Mateo
2023 — conf
Sargantana: An Academic SoC RISC-V Processor in 22nm FDSOI Technology.
DCIS
Max Doblas, Gerard Candón, Xavier Carril, Marc Domínguez, Enric Erra, Alberto González, César Hernández, Víctor Jiménez, Vatistas Kostalampros, Rubén Langarita, Neiel Leyva, Guillem López-Paradís, Jonnatan Mendoza, Josep Oltra, Julián Pavón, Cristóbal Ramírez, Narcís Rodas, Enrico Reggiani, Mario Rodríguez, Carlos Rojas, Abraham Ruiz, Hugo Safadi, Víctor Soria, Alejandro Suanes, Iván Vargas, Fernando Arreza, Roger Figueras, Pau Fontova-Musté, Joan Marimon, Ricardo Martínez, Sergio Moreno, Jordi Sacristán, Oscar Alonso, Xavier Aragonès, Adrián Cristal, Ángel Diéguez, Manuel López, Diego Mateo, Francesc Moll, Miquel Moretó, Oscar Palomar, Marco A. Ramírez, Francisco Serra-Graells, Nehir Sönmez, Lluís Terés, Osman S. Unsal, Mateo Valero, Luis Villa
2022 — conf
An Ultra Low-Voltage RF Front-end Receiver for IoT Devices.
PRIME
Francesco Malena, Xavier Aragonès, Diego Mateo, Michele Caselli, Andrea Boni
2021 J jnl
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits.
Sensors
Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter
2020 — conf
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation.
IRPS
Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas
2019 J jnl
A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI.
IEEE J. Solid State Circuits
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Xavier Aragonès, Enrique Barajas, Diego Mateo, Francisco V. Fernández, Montserrat Nafría
2019 C conf
Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling.
ISCAS
Xavier Aragonès, Diego Mateo, Enrique Barajas, Albert Crespo-Yepes, Rosana Rodríguez, Javier Martín-Martínez, Montserrat Nafría
2019 — conf
Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology.
DCIS
Xavier Aragonès, Alex Alvarez, Juan Pablo Rovayo, Josep Altet, Diego Mateo
2019 J jnl
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology.
Sensors
Enrique Barajas, Xavier Aragonès, Diego Mateo, Josep Altet
2019 — conf
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits.
DCIS
Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo
2018 — conf
Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology.
PATMOS
Enrique Barajas, Xavier Aragonès, Diego Mateo, Francesc Moll, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Marc Porti, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2017 — conf
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging.
SMACD
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Enrique Barajas, Xavier Aragonès, Diego Mateo
2014 J jnl
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.
Microelectron. J.
Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
2014 — conf
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.
MWSCAS
Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo
2013 J jnl
Inductor shielding strategies to protect mmW LC-VCOs from high frequency substrate noise.
Microelectron. J.
Marc Molina, Xavier Aragonès, Diego Mateo, José Luis González
2012 J jnl
A small-area inductorless configurable wideband LNA with high dynamic range.
Microelectron. J.
Xavier Trulls, Diego Mateo, Adria Bofill
2012 A conf
DC temperature measurements for power gain monitoring in RF power amplifiers.
ITC
Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà
2012 J jnl
Electro-thermal coupling analysis methodology for RF circuits.
Microelectron. J.
Didac Gómez, Cédric Dufis, Josep Altet, Diego Mateo, José Luis González
2012 C conf
On line monitoring of RF power amplifiers with embedded temperature sensors.
IOLTS
Josep Altet, Diego Mateo, Didac Gómez
2012 J jnl
On the Use of Static Temperature Measurements as Process Variation Observable.
J. Electron. Test.
Didac Gómez, Josep Altet, Diego Mateo
2011 J jnl
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor.
IEEE Trans. Circuits Syst. I Regul. Pap.
Marvin Onabajo, Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, José Silva-Martínez
2011 J jnl
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations.
J. Electron. Test.
Marvin Onabajo, Didac Gómez, Eduardo Aldrete-Vidrio, Josep Altet, Diego Mateo, José Silva-Martínez
2010 C conf
Behavioural Modelling of DLLs for Fast Simulation and Optimisation of Jitter and Power Consumption.
DSD
Enrique Barajas, Diego Mateo, José Luis González
2010 C conf
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits.
IOLTS
Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio
2009 A conf
Non-invasive RF built-in testing using on-chip temperature sensors.
ITC
Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez
2008 C conf
A low-power RF front-end for 2.5 GHz receivers.
ISCAS
Laura Moreno, Didac Gómez, José Luis González, Diego Mateo, Xavier Aragonès, Roc Berenguer, Héctor Solar
2008 B conf
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.
ETS
Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire
2007 J jnl
Electrical characterization of analogue and RF integrated circuits by thermal measurements.
Microelectron. J.
Diego Mateo, Josep Altet, Eduardo Aldrete-Vidrio
2007 A conf
Interactive presentation: Behavioral modeling of delay-locked loops and its application to jitter optimization in ultra wide-band impulse radio systems.
DATE
Enrique Barajas, R. Cosculluela, D. Coutinho, Diego Mateo, José Luis González, I. Cairò, S. Banda, M. Ikeda
2006 C conf
High level spectral-based analysis of power consumption in DSPs systems.
ISCAS
Antonio Calomarde, Diego Mateo, Antonio Rubio
2006 C conf
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements.
ISCAS
Josep Altet, Diego Mateo, José Luis González, Eduardo Aldrete-Vidrio
2005 J jnl
An investigation on the relation between digital circuitry characteristics and power supply noise spectrum in mixed-signal CMOS integrated circuits.
Microelectron. J.
Miguel A. Méndez, José Luis González, Diego Mateo, Antonio Rubio
2005 — conf
Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics.
ISCAS (5)
Enrique Barajas, Luis Elvira, Miguel A. Méndez, Ferran Martorell, Diego Mateo, José Luis González
2005 — conf
Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling.
ESSCIRC
Miguel A. Méndez, Diego Mateo, Xavier Aragonès, José Luis González
2003 A conf
Modeling and Evaluation of Substrate Noise Induced by Interconnects.
DATE
Ferran Martorell, Diego Mateo, Xavier Aragonès
1998 J jnl
Design and implementation of a 5×5 trits multiplier in a quasi-adiabatic ternary CMOS logic.
IEEE J. Solid State Circuits
Diego Mateo, Antonio Rubio
1996 — conf
Analysis of ISSQ/IDDQ Testing Implementation and Circuit Partitioning in CMOS Cell-Based Design.
ED&TC
M. Rullán, Carles Ferrer, Joan Oliver, Diego Mateo, Antonio Rubio
1995 — conf
A built-in quiescent current monitor for CMOS VLSI circuits.
ED&TC
Antonio Rubio, Edmond Janssens, H. Casier, Joan Figueras, Diego Mateo, P. De Pauw, Jaume Segura
1995 Misc conf
An approach to dynamic power consumption current testing of CMOS ICs.
VTS
Jaume A. Segura, Miquel Roca, Diego Mateo, Antonio Rubio