| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2026 | J | jnl |
Technometrics
|
| 2026 | J | jnl |
Stat. Comput.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | J | jnl |
Sensors
|
| 2023 | J | jnl |
Technometrics
|
| 2023 | J | jnl |
IET Image Process.
|
| 2023 | A* | conf |
ACM Multimedia
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2022 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2022 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2022 | — | conf |
SmartWorld/UIC/ScalCom/DigitalTwin/PriComp/Meta
|
| 2020 | J | jnl |
J. Robotics
|
| 2019 | J | jnl |
IEEE Robotics Autom. Lett.
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
Technometrics
|
| 2015 | J | jnl |
J. Syst. Sci. Complex.
|
| 2011 | J | jnl |
J. Syst. Sci. Complex.
|
| 2009 | — | conf |
BMEI
|