Devin Verreck - RankMe

12 papers Unranked 12

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework. IRPS Yusuke Higashi, Anirudh Varanasi, Philippe J. Roussel, Pablo Saraza-Canflanca, J. P. Bastos, Alexander Grill, E. Catapano, Ruben Asanovski, Jacopo Franco, Ben Kaczer, Adrian Chasin, Devin Verreck, S. Ramesh, Laurent Breuil, Antonio Arreghini, S. Rachidi, Y. Jeong, Geert Van den Bosch, Maarten Rosmeulen, Robin Degraeve
2025	—	`conf`	Hole-Side Airgap Integration as Enabler for 3D NAND Flash Z-Pitch Scaling. IMW S. Rachidi, S. Ramesh, Devin Verreck, J. Loyo, Y. Jeong, H. Puliyalil, Jie Li, F. Seidel, Geert Van den Bosch, Maarten Rosmeulen
2023	—	`conf`	Enabling 3D NAND Trench Cells for Scaled Flash Memories. IMW S. Rachidi, S. Ramesh, Laurent Breuil, Z. Tao, Devin Verreck, G. L. Donadio, Antonio Arreghini, Geert Van den Bosch, Maarten Rosmeulen
2023	—	`conf`	Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs. IRPS L. Panarella, Ben Kaczer, Quentin Smets, Devin Verreck, Tom Schram, Daire Cott, Dennis Lin, Stanislav Tyaginov, Inge Asselberghs, Cesar J. Lockhart de la Rosa, Gouri Sankar Kar, Valeri Afanas'ev
2023	—	`conf`	The Promise of 2-D Materials for Scaled Digital and Analog Applications. ISSCC Devin Verreck, Piet Wambacq, Maarten Van De Put, Zubair Ahmed, Quentin Smets, Aryan Afzalian, Rutger Duflou, Xiangyu Wu, Gioele Mirabelli, Rongmei Chen, Inge Asselberghs, Gouri Sankar Kar
2022	—	`conf`	Analysis of BTI in 300 mm integrated dual-gate WS2 FETs. DRC L. Panarella, Quentin Smets, Devin Verreck, Tom Schram, Daire Cott, Inge Asselberghs, Ben Kaczer
2022	—	`conf`	At the Extreme of 3D-NAND Scaling: 25 nm Z-Pitch with 10 nm Word Line Cells. IMW S. Rachidi, Antonio Arreghini, Devin Verreck, G. L. Donadio, K. Banerjee, K. Katcko, Yusuke Oniki, Geert Van den Bosch, Maarten Rosmeulen
2022	—	`conf`	Liquid Memory and the Future of Data Storage. IMW Maarten Rosmeulen, Cesar J. Lockhart de la Rosa, Kherim Willems, S. Fransen, B.-Y. Shih, Devin Verreck, V. Kalangi, F. Yasin, Harold Philipsen, Y. T. Set, N. Ronchi, W. Van Roy, O. Y. F. Henry, Antonio Arreghini, Geert Van den Bosch, Arnaud Furnémont
2021	—	`conf`	A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics. IMW Franz Schanovsky, Devin Verreck, Antonio Arreghini, Gerhard Rzepa, Zlatan Stanojevic, Christian Kernstock, Oskar Baumgartner, Maarten Rosmeulen, Markus Karner
2019	—	`conf`	Impact of Mechanical Stress on the Electrical Performance of 3D NAND. IRPS Anastasiia Kruv, Antonio Arreghini, Mario Gonzalez, Devin Verreck, Geert Van den Bosch, Ingrid De Wolf, Arnaud Furnémont
2016	—	`conf`	Beyond-Si materials and devices for more Moore and more than Moore applications. ICICDT Nadine Collaert, AliReza Alian, Hiroaki Arimura, Geert Boccardi, Geert Eneman, Jacopo Franco, Tsvetan Ivanov, Dennis Lin, Jérôme Mitard, S. Ramesh, R. Rooyackers, Marc Schaekers, A. Sibaya-Hernandez, S. Sioncke, Quentin Smets, Abhitosh Vais, A. Vandooren, Anabela Veloso, Anne S. Verhulst, Devin Verreck, Niamh Waldron, Amey Walke, Liesbeth Witters, H. Yu, X. Zhou, Aaron Voon-Yew Thean
2016	—	`conf`	Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect transistors. ESSDERC Devin Verreck, Anne S. Verhulst, Bart Soree, Nadine Collaert, Anda Mocuta, Aaron Thean, Guido Groeseneken