Dennis R. Ball

13 papers Unranked 13

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Power and SER Performance of Flip-Flop Cells with Low-Leakage Options. IRPS Nicholas J. Pieper, Y. Xiong, Jenna B. Kronenberg, R. Fung, Dennis R. Ball, Bharat L. Bhuva
2025	—	`conf`	Power-Aware Mitigation of Logic Soft Error Rates at the 3-nm Bulk FinFET Node. IRPS Jenna B. Kronenberg, Y. Xiong, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva
2024	—	`conf`	Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node. IRPS Yoni Xiong, Nicholas J. Pieper, Jenna B. Kronenberg, Dennis R. Ball, Megan Casey, Bharat L. Bhuva
2024	—	`conf`	Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET. IRPS Balaji Narasimham, A-R. Montoya, C. Paone, T. Riehle, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva
2024	—	`conf`	Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages. IRPS Jenna B. Kronenberg, Yoni Xiong, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva
2023	—	`conf`	Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node. IRPS Nicholas J. Pieper, Yoni Xiong, Dennis R. Ball, J. Pasternak, Bharat L. Bhuva
2023	—	`conf`	Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate. DRC Sajal Islam, Aditha S. Senarath, Arijit Sengupta, En-xia Zhang, Dennis R. Ball, Daniel M. Fleetwood, Ronald D. Schrimpf, Esmat Farzana, Arkka Bhattacharyya, Nolan S. Hendricks, James S. Speck
2023	—	`conf`	Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology. IRPS Yoni Xiong, Yueh Chiang, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva
2022	—	`conf`	Single-Event Latchup Vulnerability at the 7-nm FinFET Node. IRPS Nicholas J. Pieper, Yoni Xiong, Alexandra Feeley, Dennis R. Ball, Bharat L. Bhuva
2022	—	`conf`	Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. IRPS Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva
2021	—	`conf`	Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET. IRPS Balaji Narasimham, Vikas Chaudhary, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva
2020	—	`conf`	High-Current State triggered by Operating-Frequency Change. IRPS Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva
2015	—	`conf`	Multi-cell soft errors at the 16-nm FinFET technology node. IRPS N. Tam, Bharat L. Bhuva, Lloyd W. Massengill, Dennis R. Ball, Michael W. McCurdy, Michael L. Alles, Indranil Chatterjee