Dennis D. Weller

12 papers A* 1A 4Journal 6Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
Efficient Analog Error Correction for Printed Unary-Encoded Computing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Priyanjana Pal, Brojogopal Sapui, Dennis D. Weller, Mehdi B. Tahoori
2022 J jnl
Artificial Neurons on Flexible Substrates: A Fully Printed Approach for Neuromorphic Sensing.
Sensors
Surya A. Singaraju, Dennis D. Weller, Thurid S. Gspann, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
2022 J jnl
Fast and Efficient High-Sigma Yield Analysis and Optimization Using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dennis D. Weller, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori
2022 A conf
In-situ Tuning of Printed Neural Networks for Variation Tolerance.
DATE
Michael Hefenbrock, Dennis D. Weller, Jasmin Aghassi-Hagmann, Michael Beigl, Mehdi B. Tahoori
2021 A conf
Printed Stochastic Computing Neural Networks.
DATE
Dennis D. Weller, Nathaniel Bleier, Michael Hefenbrock, Jasmin Aghassi-Hagmann, Michael Beigl, Rakesh Kumar, Mehdi B. Tahoori
2020 J jnl
A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit.
IEEE Trans. Very Large Scale Integr. Syst.
Ahmet Turan Erozan, Dennis D. Weller, Farhan Rasheed, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori
2020 J jnl
A Printed Camouflaged Cell Against Reverse Engineering of Printed Electronics Circuits.
IEEE Trans. Very Large Scale Integr. Syst.
Ahmet Turan Erozan, Dennis D. Weller, Yijing Feng, Gabriel Cadilha Marques, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
2020 J jnl
Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori
2020 A conf
Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling.
DATE
Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori
2020 A* conf
Printed Machine Learning Classifiers.
MICRO
Muhammad Husnain Mubarik, Dennis D. Weller, Nathaniel Bleier, Matthew Tomei, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar
2020 — conf
Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors.
ASP-DAC
Dennis D. Weller, Michael Hefenbrock, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Michael Beigl
2019 A conf
Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation.
DATE
Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Mehdi Baradaran Tahoori