Denis Teixeira Franco

20 papers A 1C 1Journal 4Unranked 14
YearRankTypeTitle / Venue / Authors
2019 C conf
A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates.
VLSI-SoC
Rafael B. Schvittz, Denis Teixeira Franco, Leomar Soares da Rosa Júnior, Paulo Francisco Butzen
2019 — conf
An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults.
VLSI-SoC (Selected Papers)
Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa, Paulo F. Butzen
2018 — conf
Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults.
ICECS
Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa Jr., Paulo F. Butzen
2018 — conf
Reliability evaluation of circuits designed in multi- and single-stage versions.
LASCAS
Rafael B. Schvittz, Matheus F. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, Leomar S. da Rosa, Paulo F. Butzen
2018 — conf
The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits.
ICECS
Matheus F. Pontes, Paulo F. Butzen, Rafael B. Schvittz, Leomar S. da Rosa Jr., Denis Teixeira Franco
2017 — conf
Exploring BDDs to reduce test pattern set.
LATS
Gabriel S. Porto, Paulo F. Butzen, Denis Teixeira Franco
2016 — conf
A probabilistic model for stuck-on faults in combinational logic gates.
LATS
Rafael B. Schivittz, Denis Teixeira Franco, Cristina Meinhardt, Paulo F. Butzen
2016 — conf
Inserting permanent fault input dependence on PTM to improve robustness evaluation.
SBCCI
Rafael B. Schivittz, Rafael Fritz, Denis Teixeira Franco, Lirida A. B. Naviner, Cristina Meinhardt, Paulo F. Butzen
2013 — conf
A system based on interval fuzzy approach to predict the appearance of pests in agriculture.
IFSA/NAFIPS
Leonardo Martins Rodrigues, Graçaliz Pereira Dimuro, Denis Teixeira Franco, Jose Carlos Fachinello
2010 — conf
On evaluating the signal reliability of self-checking arithmetic circuits.
SBCCI
Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner, Jean-François Naviner
2008 — conf
Methods and Metrics for Reliability Assessment.
Fault-Tolerant Distributed Algorithms on VLSI Chips
Lirida Alves de Barros Naviner, Jean-François Naviner, Denis Teixeira Franco, Maí Correia R. de Vasconcelos
2008 — conf
On the output events in concurrent error detection schemes.
ICECS
Maí Correia R. de Vasconcelos, Denis Teixeira Franco, Lirida A. B. Naviner, Jean-François Naviner
2008 J jnl
Relevant metrics for evaluation of concurrent error detection schemes.
Microelectron. Reliab.
Maí Correia R. de Vasconcelos, Denis Teixeira Franco, Lirida A. B. Naviner, Jean-François Naviner
2008 — conf
Reliability analysis of logic circuits based on signal probability.
ICECS
Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner, Jean-François Naviner
2008 J jnl
Signal probability for reliability evaluation of logic circuits.
Microelectron. Reliab.
Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner, Jean-François Naviner
2006 J jnl
Yield and reliability issues in nanoelectronic technologies.
Ann. des Télécommunications
Denis Teixeira Franco, Jean-François Naviner, Lirida A. B. Naviner
2003 J jnl
Circuit-Level Considerations for Mixed-Signal Programmable Components.
IEEE Des. Test Comput.
Luigi Carro, Marcelo Negreiros, Gabriel Parmegiani Jahn, Adão Antônio de Souza Jr., Denis Teixeira Franco
2000 — conf
FPGA Architecture Comparison for Non-Conventional Signal Processing.
IJCNN (2)
Denis Teixeira Franco, Luigi Carro
2000 — conf
FPGA Based Systems with Linear and Non-Linear Signal Processing Capabilities.
EUROMICRO
Luigi Carro, Denis Teixeira Franco
2000 A conf
Non-Linear Components for Mixed Circuits Analog Front-End.
DATE
Luigi Carro, Adão Antônio de Souza Jr., Marcelo Negreiros, Gabriel Parmegiani Jahn, Denis Teixeira Franco