| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Computing
|
| 2024 | J | jnl |
Symmetry
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Neurocomputing
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Comput. Ind.
|
| 2020 | J | jnl |
Run-to-run control of batch production process in manufacturing systems based on online measurement.
Comput. Ind. Eng.
|
| 2018 | — | conf |
IEEM
|
| 2015 | J | jnl |
Comput. Ind. Eng.
|
| 2015 | J | jnl |
Comput. Ind. Eng.
|
| 2013 | J | jnl |
Comput. Ind. Eng.
|