Degang Chen - RankMe

245 papers A* 1A 27B 2C 62Misc 14Journal 59Unranked 80

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	Gradient Minimization in Layout Patterns for Analog Circuits. Circuits Syst. Signal Process. Isaac Bruce, Michael Sekyere, Ruohan Yang, Saeid Karimpour, Colin C. McAndrew, Degang Chen
2025	J	`jnl`	A 32 μm2 MOS-Based Remote Sensing Temperature Sensor with 1.29 °C Inaccuracy for Thermal Management. Comput. Ruohan Yang, Kwabena Oppong Banahene, Bryce Gadogbe, Randall L. Geiger, Degang Chen
2025	C	`conf`	A Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity. ISCAS Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Saeid Karimpour, Kushagra Bhatheja, Degang Chen
2025	A	`conf`	An On-Chip Sensor For Online Monitoring of HCI-Induced Aging In Integrated Analog Circuits. ITC Saeid Karimpour, Emmanuel Nti Darko, Degang Chen
2025	—	`conf`	Digital Defect Oriented Test Method for Phase Locked Loops with High Coverage. I2MTC Michael Sekyere, Marampally Saikiran, Godfred Bonsu, Kelvin W. Tamakloe, Rob Butler, Reed Adams, Degang Chen
2025	J	`jnl`	Digitally Calibrated Redundancy-Based String DAC: A Novel Architecture for Enhanced Static Linearity. IEEE Trans. Circuits Syst. II Express Briefs Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen
2025	—	`conf`	Efficient Hybrid Resistor-String and Capacitor DAC with Area Efficient Redundancy-Based Digital Calibration for High-Performance Applications. I2MTC Ekaniyere Oko-Odion, Emmanuel Nti Darko, Isaac Bruce, Matthew Crabb, Degang Chen
2025	Misc	`conf`	High-Accuracy, Cost-Effective Built-In Self-Test Approach for High-Resolution Data Converters. VTS Emmanuel Nti Darko, Saeid Karimpour, Degang Chen
2025	J	`jnl`	Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Michael Sekyere, Isaac Bruce, Ruohan Yang, Degang Chen, Colin C. McAndrew, Xiankun Jin, Chen He, Doug Garrity
2025	C	`conf`	Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry. ISCAS Michael Sekyere, Marampally Saikiran, Rob Butler, Reed Adams, Degang Chen
2025	C	`conf`	Signal Flow Graph Analysis of Analog Circuits using Principles of Control Theory : Tutorial Review. ISCAS Michael Sekyere, Marampally Saikiran, Degang Chen
2025	J	`jnl`	Ultra-Low Leakage Current Sensor With Large Dynamic Range. IEEE Trans. Circuits Syst. II Express Briefs Emmanuel Nti Darko, Saeid Karimpour, Daniel Adjei, Kushagra Bhatheja, Degang Chen
2025	A	`conf`	Ultra-Pure High-Resolution Waveform Generation Using Low-Cost Data Converters with Dithering. ITC Emmanuel Nti Darko, Saeid Karimpour, Ekaniyere Oko-Odion, Godfred Bonsu, Degang Chen
2024	—	`conf`	A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities. ISVLSI Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Matthew Crabb, Degang Chen
2024	J	`jnl`	A BIST Approach to Approximate Co-Testing of Embedded Data Converters. IEEE Des. Test Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen
2024	—	`conf`	A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs. MWSCAS Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen
2024	A	`conf`	A Robust On-Chip Sensor for Online Monitoring of BTI-Induced Aging in Integrated Circuits. ITC Daniel Adjei, Emmanuel Nti Darko, Degang Chen
2024	—	`conf`	Invited Paper: Low Power, Fully-Integrated Flipped Voltage Follower LDO Using Off-State Non-Linear Circuits for Enhanced Transient Performance. MWSCAS Michael Sekyere, Degang Chen
2024	—	`conf`	Novel Single-Temperature Trim Techniques for Bandgap Voltage References. MWSCAS Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger
2024	—	`conf`	Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm. MWSCAS Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen
2024	—	`conf`	Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm. ISVLSI Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen
2023	—	`conf`	A Compact and Accurate MOS-based Temperature Sensor for Thermal Management. MWSCAS Ruohan Yang, Bryce Gadogbe, Randall L. Geiger, Degang Chen
2023	—	`conf`	A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers. EWDTS Michael Sekyere, Marampally Saikiran, Degang Chen
2023	C	`conf`	A Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction Technique. ISCAS Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger
2023	J	`jnl`	A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electron. Test. Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2023	—	`conf`	An Architectural Framework for On-Line Health Monitoring of Integrated Circuits. MWSCAS Kushagra Bhatheja, Degang Chen
2023	—	`conf`	An Improved Single-Temperature Trim Technique for 1 MWSCAS Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger, Shravan K. Chaganti, Dhyey Desai, Jerry Doorenbos, Jim Todsen
2023	—	`conf`	Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview. EWDTS Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen
2023	—	`conf`	Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency. EWDTS Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen
2023	J	`jnl`	Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. IEEE Des. Test Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2023	—	`conf`	Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. MWSCAS Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen
2023	C	`conf`	Sub-ppm/°C High Performance Voltage Reference. ISCAS Bryce Gadogbe, Daniel Adjei, Kwabena Oppong Banahene, Randall L. Geiger, Degang Chen
2023	—	`conf`	Systematic Methodology to Design High Precision Voltage References with Sub-ppm/°C Temperature Coefficient. EWDTS Vijayalakshmi Naganadhan, Marampally Saikiran, Mahmoud Gshash, Degang Chen
2023	—	`conf`	Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. MWSCAS Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen
2023	—	`conf`	Very Compact Temperature Sensor for Power/Thermal Management. MWSCAS Bryce Gadogbe, Ruohang Yang, Kwabena Oppong Banahene, Pallavi Ebenezer, Randall L. Geiger, Degang Chen
2022	J	`jnl`	A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. J. Electron. Test. Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022	—	`conf`	A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits. SBCCI Marampally Saikiran, Mona Ganji, Degang Chen
2022	C	`conf`	A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models. ISCAS Mona Ganji, Marampally Saikiran, Degang Chen
2022	C	`conf`	All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage. IOLTS Michael Sekyere, Marampally Saikiran, Degang Chen
2022	Misc	`conf`	All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. VTS Mona Ganji, Marampally Saikiran, Degang Chen
2022	—	`conf`	Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. DFT Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022	—	`conf`	Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators. SBCCI Marampally Saikiran, Mona Ganji, Degang Chen
2022	B	`conf`	Graph Theory Approach for Multi-site ATE Board Parameter Extraction. ETS Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022	C	`conf`	Hardware Security Vulnerability in Analog Signal Chain Filters. ISCAS Kwabena Oppong Banahene, Matthew R. Strong, Bryce Gadogbe, Degang Chen, Randall L. Geiger
2022	C	`conf`	Level Shifters for Charge Constrained Applications. ISCAS Kushagra Bhatheja, Matthew R. Strong, Degang Chen
2022	A	`conf`	Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. ITC Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity
2022	A	`conf`	Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ITC Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022	C	`conf`	Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection. ISCAS Marampally Saikiran, Mona Ganji, Degang Chen
2022	Misc	`conf`	The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021	—	`conf`	A Simple Monitor for Tracking NBTI in Integrated Systems. MWSCAS Matthew R. Strong, Kushagra Bhatheja, Ruohan Yang, Degang Chen
2021	B	`conf`	An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. ETS Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021	J	`jnl`	Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing. IEEE Trans. Instrum. Meas. Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021	J	`jnl`	Fast Gate Leakage Current Monitor With Large Dynamic Range. IEEE Trans. Circuits Syst. II Express Briefs Kushagra Bhatheja, Xiankun Jin, Matthew R. Strong, Degang Chen
2021	—	`conf`	Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021	J	`jnl`	Sub-ppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation. IEEE Trans. Circuits Syst. I Regul. Pap. Nanqi Liu, Randall L. Geiger, Degang Chen
2021	A	`conf`	Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. ITC Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2020	J	`jnl`	A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. IEEE Trans. Circuits Syst. Chulhyun Park, Tao Chen, Kyoohyun Noh, Dadian Zhou, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Aydin I. Karsilayan, Degang Chen, Randall L. Geiger, José Silva-Martínez
2020	J	`jnl`	A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. IEEE Trans. Instrum. Meas. Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen
2020	C	`conf`	A Low-Power and Area-Efficient Analog Duty Cycle Corrector for ADC's External Clocks. ISCAS Nanqi Liu, Jim Todsen, Degang Chen
2020	C	`conf`	A Simple Bandgap Reference Based on VGO Extraction with Single-Temperature Trimming. ISCAS Pangzhou Li, Nanqi Liu, Degang Chen
2020	J	`jnl`	A Transient-Enhanced Output-Capacitorless LDO With Fast Local Loop and Overshoot Detection. IEEE Trans. Circuits Syst. Nanqi Liu, Degang Chen
2020	J	`jnl`	An 8-bit Low-Cost String DAC With Gradient Errors Suppression to Achieve 16-bit Linearity. IEEE Trans. Circuits Syst. I Regul. Pap. Nanqi Liu, Jim Todsen, Degang Chen
2020	J	`jnl`	An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen
2020	—	`conf`	Least Square Based Jitter Decomposition Algorithm for a PAM4 link. MWSCAS Kushagra Bhatheja, Srikanth Jagannathan, Degang Chen
2020	J	`jnl`	MIRE: A Multitone Identification and Replacement Method for Multitone Spectral Test Without Requiring Coherent Sampling. IEEE Trans. Instrum. Meas. Minshun Wu, Cheng Ban, Jiangtao Xu, Li Geng, Degang Chen
2020	Misc	`conf`	Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing. VTS Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2020	A	`conf`	Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage. ITC Marampally Saikiran, Mona Ganji, Degang Chen
2020	—	`conf`	Three-Junction Bandgap Circuit with Sub 1 ppm/°C Temperature Coefficient. MWSCAS Pallavi Sugantha Ebenezer, Vijayalakshmi Naganadhan, Degang Chen, Randall L. Geiger
2019	—	`conf`	A Precision Bandgap Voltage Reference Using Curvature Elimination Technique. MWSCAS Pallavi Ebenezer, Tyler Archer, Degang Chen, Randall L. Geiger
2019	Misc	`conf`	An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test. VTS Cheng Ban, Minshun Wu, Jiangtao Xu, Li Geng, Degang Chen
2019	C	`conf`	Bandgap Voltage VGO Extraction with Two-Temperature Trimming for Designing Sub-ppm/°C Voltage References. ISCAS Nanqi Liu, Randy Geiger, Degang Chen
2019	A	`conf`	Built-in self-test and self-calibration for analog and mixed signal circuits. ITC Tao Chen, Degang Chen
2019	J	`jnl`	Low-Cost, High-Precision DAC Design Based on Ordered Element Matching. IEEE Trans. Circuits Syst. I Regul. Pap. You Li, Degang Chen
2018	C	`conf`	A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs. ISCAS Hao Meng, Randall L. Geiger, Degang Chen
2018	C	`conf`	A Transient-Enhanced Fully-Integrated LDO Regulator for SoC Application. ISCAS Nanqi Liu, Brian Johnson, Vinay Nadig, Degang Chen
2018	C	`conf`	A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling. ISCAS Shravan K. Chaganti, Li Xu, Degang Chen
2018	—	`conf`	Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test. ITC-Asia Yuming Zhuang, Degang Chen
2018	C	`conf`	Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus. ISCAS Nanqi Liu, Shravan K. Chaganti, Zhiqiang Liu, Degang Chen, Amitava Majumdar
2018	—	`conf`	Cost-Effective High Purity Signal Generator Using Pre-distortion. ITC-Asia Yuming Zhuang, Degang Chen
2018	—	`conf`	Cost-effective accurate DAC-ADC co-testing and DAC linearization. I2MTC Yuming Zhuang, Degang Chen
2018	A	`conf`	Fast and accurate linearity test for DACs with various architectures using segmented models. ITC Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen
2018	J	`jnl`	High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing. IEEE Trans. Instrum. Meas. Yuming Zhuang, Benjamin Magstadt, Tao Chen, Degang Chen
2018	J	`jnl`	Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit. IEEE Trans. Circuits Syst. I Regul. Pap. Zhiqiang Liu, Shravan K. Chaganti, Degang Chen
2018	—	`conf`	Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). I2MTC Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen
2018	C	`conf`	Transparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans. ISCAS Qianqian Wang, Degang Chen, Randall L. Geiger
2018	J	`jnl`	USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen
2017	J	`jnl`	A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. J. Electron. Test. Yan Duan, Tao Chen, Degang Chen
2017	C	`conf`	A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection. ISCAS Zhiqiang Liu, Nanqi Liu, Shravan K. Chaganti, Degang Chen, Amitava Majumdar
2017	Misc	`conf`	A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter. VTS Shravan K. Chaganti, Li Xu, Degang Chen
2017	C	`conf`	A voltage reference generator targeted at extracting the silicon bandgap Vgo from Vbe. ISCAS Zhiqiang Liu, Degang Chen
2017	J	`jnl`	ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling. J. Electron. Test. Yuming Zhuang, Degang Chen
2017	A	`conf`	Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. ITC Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen
2017	J	`jnl`	Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency. IEEE Trans. Instrum. Meas. Yuming Zhuang, Li Xu, Degang Chen
2017	J	`jnl`	Accurate Spectral Testing With Non-Coherent Sampling for Multi-Tone Test. IEEE Trans. Circuits Syst. II Express Briefs Yuming Zhuang, Degang Chen
2017	A	`conf`	Accurate and robust spectral testing with relaxed instrumentation requirements. ITC Yuming Zhuang, Degang Chen
2017	Misc	`conf`	Accurate jitter decomposition in high-speed links. VTS Yan Duan, Degang Chen
2017	C	`conf`	Accurate spectral testing of the signals with amplitude drift. ISCAS Yuming Zhuang, Degang Chen
2017	J	`jnl`	Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion. IEEE Trans. Instrum. Meas. Yuming Zhuang, Degang Chen
2017	A	`conf`	An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen
2017	J	`jnl`	Efficient Verification Against Undesired Operating Points for MOS Analog Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. You Li, Zhiqiang Liu, Degang Chen
2017	—	`conf`	Practical linear and quadratic gradient errors suppression techniques in string DACs. MWSCAS Nanqi Liu, Chris Lash, Jim Todsen, Degang Chen
2017	—	`conf`	Systematic and random mismatch characterization in device arrays. MWSCAS Nanqi Liu, Chris Lash, Jim Todsen, Degang Chen
2017	—	`conf`	Technique for generating timing skew resistant time-interleaved signals. MWSCAS Qianqian Wang, Degang Chen, Randall L. Geiger
2016	J	`jnl`	Accurate Spectral Testing With Impure Source and Noncoherent Sampling. IEEE Trans. Instrum. Meas. Benjamin Magstadt, Yuming Zhuang, Degang Chen
2016	Misc	`conf`	Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. VTS Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
2016	Misc	`conf`	Accurate spectral testing with non-coherent sampling for large distortion to noise ratios. VTS Yuming Zhuang, Degang Chen
2016	A	`conf`	Low cost ultra-pure sine wave generation with self calibration. ITC Yuming Zhuang, Akhilesh Kesavan Unnithan, Arun Joseph, Siva Sudani, Benjamin Magstadt, Degang Chen
2016	C	`conf`	Low-cost dithering generator for accurate ADC linearity test. ISCAS Yan Duan, Tao Chen, Degang Chen
2016	J	`jnl`	New Strategies in Removing Noncoherency From Signals With Large Distortion-to-Noise Ratios. IEEE Trans. Circuits Syst. II Express Briefs Yuming Zhuang, Degang Chen
2016	C	`conf`	New strategies in removing non-coherency from signals with large distortion to noise ratios. ISCAS Yuming Zhuang, Degang Chen
2016	C	`conf`	Toward complete analog fault coverage with minimal observation points using a fault propagation graph. ISCAS Zhiqiang Liu, Shravan K. Chaganti, Degang Chen
2015	J	`jnl`	A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods. IEEE Des. Test Siva Kumar Sudani, Li Xu, Degang Chen
2015	C	`conf`	A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit. ISCAS Xu Zhang, Chongli Cai, Hao Meng, Siva Sudani, Randall L. Geiger, Degang Chen
2015	—	`conf`	A hardware Trojan embedded in the Inverse Widlar reference generator. MWSCAS Xing Cao, Qianqian Wang, Randall L. Geiger, Degang Chen
2015	C	`conf`	A low cost jitter estimation and ADC spectral testing method. ISCAS Li Xu, Degang Chen
2015	Misc	`conf`	A low cost jitter separation and characterization method. VTS Li Xu, Yan Duan, Degang Chen
2015	C	`conf`	A novel 20-bit R-2R DAC structure based on ordered element matching. ISCAS You Li, Degang Chen
2015	C	`conf`	A programmable temperature trigger circuit. ISCAS Qianqian Wang, Randall L. Geiger, Degang Chen
2015	—	`conf`	A simple ramp generator with level spreading for SEIR based ADC BIST circuit. MWSCAS Hao Meng, Degang Chen
2015	—	`conf`	A slew-rate enhancement technique for fully differential amplifier without inducing Trojan state. MWSCAS Chongli Cai, Degang Chen
2015	C	`conf`	Accurate spectral testing of analog-to-digital converters with frequency drift using phase correction and averaging. ISCAS Li Xu, Degang Chen
2015	C	`conf`	An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-bit resolution analog-to-digital converter. ISCAS Xu Zhang, Degang Chen
2015	C	`conf`	Cascode and transconductance with capacitances feedback compensation for multistage amplifiers driving no load and 1nF capacitive load. ISCAS Xu Zhang, Chongli Cai, Degang Chen, Gregory Blum
2015	C	`conf`	Direct temperature to digital converters with low supply sensitivity for power/thermal management. ISCAS Yen-Ting Wang, Chen Zhao, Degang Chen, Randall L. Geiger
2015	—	`conf`	Effect of flicker noise on SEIR for accurate ADC linearity testing. MWSCAS Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
2015	J	`jnl`	Extracting random jitter and sinusoidal jitter in ADC output with a single frequency test. IEICE Electron. Express Minshun Wu, Zhiqiang Liu, Degang Chen
2015	C	`conf`	High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. ISCAS Yan Duan, Tao Chen, Zhiqiang Liu, Xu Zhang, Degang Chen
2015	C	`conf`	Performance enhancement induced Trojan states in op-amps, their detection and removal. ISCAS Chongli Cai, Degang Chen
2015	—	`conf`	Switched-compensation technique in switched-capacitor circuit for achieving fast settling performance. MWSCAS Jiaming Liu, Hao Meng, Degang Chen
2015	Misc	`conf`	Ultrafast stimulus error removal algorithm for ADC linearity test. VTS Tao Chen, Degang Chen
2014	—	`conf`	A CMOS supply-insensitive with 13ppm/°C temperature coefficient current reference. MWSCAS Yen-Ting Wang, Degang Chen, Randall L. Geiger
2014	—	`conf`	A high gain operational amplifier via an efficient conductance cancellation technique. CICC Bin Huang, Degang Chen
2014	—	`conf`	A simple slew rate enhancement technique with improved linearity and preserved small signal performance. MWSCAS Bin Huang, Degang Chen
2014	Misc	`conf`	Accurate and efficient method of jitter and noise separation and its application to ADC testing. VTS Li Xu, Degang Chen
2014	—	`conf`	An effective conductance cancellation method with minimal design effort. MWSCAS Bin Huang, Degang Chen
2014	Misc	`conf`	Auto-identification of positive feedback loops in multi-state vulnerable circuits. VTS Zhiqiang Liu, You Li, Randall L. Geiger, Degang Chen
2014	—	`conf`	Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators. MWSCAS Qianqian Wang, Randall L. Geiger, Degang Chen
2014	J	`jnl`	Efficient Spectral Testing With Clipped and Noncoherently Sampled Data. IEEE Trans. Instrum. Meas. Li Xu, Siva Kumar Sudani, Degang Chen
2014	C	`conf`	Efficient analog verification against Trojan states using divide and contraction method. ISCAS You Li, Degang Chen
2014	A	`conf`	Fast co-test of linearity and spectral performance with non-coherent sampled and amplitude clipped data. ITC Li Xu, Degang Chen
2014	C	`conf`	Identification and break of positive feedback loops in Trojan States Vulnerable Circuits. ISCAS Zhiqiang Liu, You Li, Yan Duan, Randall L. Geiger, Degang Chen
2013	—	`conf`	A 15-bit binary-weighted current-steering DAC with ordered element matching. CICC Tao Zeng, Kevin Townsend, Jingbo Duan, Degang Chen
2013	C	`conf`	A CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C. ISCAS Chen Zhao, Yen-Ting Wang, David Genzer, Degang Chen, Randall L. Geiger
2013	C	`conf`	A high resolution and high accuracy R-2R DAC based on ordered element matching. ISCAS You Li, Tao Zeng, Degang Chen
2013	—	`conf`	ADC spectral testing allowing amplitude clipping. I2MTC Li Xu, Degang Chen
2013	A	`conf`	Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping. ITC Siva Sudani, Li Xu, Degang Chen
2013	J	`jnl`	An Order-Statistics Based Matching Strategy for Circuit Components in Data Converters. IEEE Trans. Circuits Syst. I Regul. Pap. Tao Zeng, Degang Chen
2013	—	`conf`	Effectiveness of circuit-level continuation methods for Trojan State Elimination verification. MWSCAS Yen-Ting Wang, Degang Chen, Randall L. Geiger
2013	J	`jnl`	FIRE: A Fundamental Identification and Replacement Method for Accurate Spectral Test Without Requiring Coherency. IEEE Trans. Instrum. Meas. Siva Kumar Sudani, Degang Chen
2013	C	`conf`	High resolution ADC spectral test with known impure source and non-coherent sampling. ISCAS Siva Sudani, Degang Chen, Randall L. Geiger
2013	J	`jnl`	Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique. IEEE Trans. Circuits Syst. I Regul. Pap. Bharath Karthik Vasan, Siva Kumar Sudani, Degang Chen, Randall L. Geiger
2013	C	`conf`	Practical methods for verifying removal of Trojan stable operating points. ISCAS Yen-Ting Wang, Degang Chen, Randall L. Geiger
2013	C	`conf`	Reliability degradation with electrical, thermal and thermal gradient stress in interconnects. ISCAS Srijita Patra, Degang Chen, Randy Geiger
2013	A	`conf`	Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations. ITC Degang Chen, Zhongjun Yu, Krunal Maniar, Mojtaba Nowrozi
2012	C	`conf`	A compact low-power supply-insensitive CMOS current reference. ISCAS Chen Zhao, Randall L. Geiger, Degang Chen
2012	C	`conf`	A low cost method for testing offset and gain error for ADC BIST. ISCAS Jingbo Duan, Degang Chen, Randall L. Geiger
2012	—	`conf`	A method for accurate full spectrum testing without requiring coherency. MWSCAS Siva Sudani, Degang Chen, Randy Geiger
2012	J	`jnl`	ADC jitter estimation using a single frequency test without requiring coherent sampling. IEICE Electron. Express Minshun Wu, Guican Chen, Degang Chen
2012	A	`conf`	Algorithm for dramatically improved efficiency in ADC linearity test. ITC Zhongjun Yu, Degang Chen
2012	J	`jnl`	An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency. J. Electron. Test. Minshun Wu, Degang Chen, Jingbo Duan
2012	—	`conf`	An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications. MWSCAS Yulong Shi, Degang Chen
2012	J	`jnl`	New Spectral Leakage-Removing Method for Spectral Testing of Approximate Sinusoidal Signals. IEEE Trans. Instrum. Meas. Minshun Wu, Degang Chen, Guican Chen
2012	J	`jnl`	On Chip Signal Generators for Low Overhead ADC BIST. J. Electron. Test. Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen, Randall L. Geiger
2012	—	`conf`	Performance verification of start-up circuits in reference generators. MWSCAS Yen-Ting Wang, Chen Zhao, Randall L. Geiger, Degang Chen, Shu-Chuan Huang
2012	—	`conf`	Reliability modeling of metal interconnects with time-dependent electrical and thermal stress. MWSCAS Srijita Patra, Degang Chen, Randy Geiger
2012	C	`conf`	Sinusoidal signal generation for production testing and BIST applications. ISCAS Bharath K. Vasan, Siva Sudani, Degang Chen, Randall L. Geiger
2012	J	`jnl`	Testing ADC Spectral Performance Without Dedicated Data Acquisition. IEEE Trans. Instrum. Meas. Jingbo Duan, Le Jin, Degang Chen
2011	A	`conf`	A novel robust and accurate spectral testing method for non-coherent sampling. ITC Siva Sudani, Minshun Wu, Degang Chen
2011	C	`conf`	Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom. ISCAS Chen Zhao, Jun He, Sheng-Huang Lee, Karl Peterson, Randall L. Geiger, Degang Chen
2011	C	`conf`	SNR measurement based on linearity test for ADC BIST. ISCAS Jingbo Duan, Degang Chen
2010	A	`conf`	A new method for estimating spectral performance of ADC from INL. ITC Jingbo Duan, Le Jin, Degang Chen
2010	C	`conf`	Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators. ISCAS Jun He, Degang Chen, Randall L. Geiger
2010	C	`conf`	INL based dynamic performance estimation for ADC BIST. ISCAS Jingbo Duan, Le Jin, Degang Chen
2010	C	`conf`	Linearity testing of ADCs using low linearity stimulus and Kalman filtering. ISCAS Bharath K. Vasan, Randall L. Geiger, Degang Chen
2010	C	`conf`	New calibration technique for current-steering DACs. ISCAS Tao Zeng, Degang Chen
2010	C	`conf`	Output impedance linearization technique for current-steering DACs. ISCAS Tao Zeng, Degang Chen
2010	C	`conf`	Phase control of triangular stimulus generator for ADC BIST. ISCAS Jingbo Duan, Degang Chen, Randall L. Geiger
2009	J	`jnl`	Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators. IEEE Trans. Circuits Syst. I Regul. Pap. Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger
2009	J	`jnl`	Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE Trans. Instrum. Meas. Le Jin, Degang Chen, Randall L. Geiger
2009	C	`conf`	Cost Effective Signal Generators for ADC BIST. ISCAS Jingbo Duan, Degang Chen, Randall L. Geiger
2009	J	`jnl`	High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE Trans. Instrum. Meas. Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger
2009	C	`conf`	Optimal Area and Impedance Allocation for Dual-string DACs. ISCAS Thu T. Duong, Degang Chen, Randall L. Geiger
2009	—	`conf`	Signal generators for cost effective BIST of ADCs. ECCTD Bharath K. Vasan, Jingbo Duan, Chen Zhao, Randall L. Geiger, Degang Chen
2008	C	`conf`	A simple and accurate method to predict offset voltage in dynamic comparators. ISCAS Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger
2008	C	`conf`	Adjustable hysteresis CMOS Schmitt triggers. ISCAS Vipul Katyal, Randall L. Geiger, Degang Chen
2008	—	`conf`	An overview and behavioral modeling of higher order multi-bit SigmaDelta A/D converters. EIT Vaibhav Kumar, Degang Chen
2008	—	`conf`	On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. EIT Hanqing Xing, Degang Chen, Randall L. Geiger
2008	C	`conf`	System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin
2008	J	`jnl`	Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE Trans. Instrum. Meas. Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen
2007	A	`conf`	A fully digital-compatible BIST strategy for ADC linearity testing. ITC Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger
2007	Misc	`conf`	Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS Le Jin, Degang Chen, Randall L. Geiger
2007	C	`conf`	Deterministic DEM DAC Performance Analysis. ISCAS Hanjun Jiang, Degang Chen, Randall L. Geiger
2007	J	`jnl`	Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques. IEEE Trans. Circuits Syst. I Regul. Pap. Chengming He, Le Jin, Degang Chen, Randy Geiger
2007	J	`jnl`	SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE Trans. Instrum. Meas. Le Jin, Degang Chen, Randall L. Geiger
2007	J	`jnl`	Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Trans. Instrum. Meas. Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger
2006	—	`conf`	A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs. APCCAS Vipul Katyal, Randall L. Geiger, Degang Chen
2006	J	`jnl`	A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. IEEE Trans. Instrum. Meas. Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
2006	C	`conf`	A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger
2006	C	`conf`	Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger
2006	C	`conf`	Explicit characterization of bandgap references. ISCAS Xin Dai, Degang Chen, Randall L. Geiger
2006	A	`conf`	Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC Le Jin, Degang Chen, Randall L. Geiger
2006	C	`conf`	Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. ISCAS Hanqing Xing, Degang Chen, Randall L. Geiger
2006	J	`jnl`	Output tracking control of a one-link flexible manipulator via causal inversion. IEEE Trans. Control. Syst. Technol. Xuezhen Wang, Degang Chen
2006	A	`conf`	Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen
2006	J	`jnl`	Yield enhancement with optimal area allocation for ratio-critical analog circuits. IEEE Trans. Circuits Syst. I Regul. Pap. Yu Lin, Degang Chen, Randall L. Geiger
2005	A	`conf`	A 16-bit resistor string DAC with full-calibration at final test. ITC Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger
2005	—	`conf`	A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs. ISCAS (5) Xin Dai, Degang Chen, Randall L. Geiger
2005	—	`conf`	A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) Le Jin, Degang Chen, Randall L. Geiger
2005	—	`conf`	A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. ISCAS (1) Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
2005	—	`conf`	A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen
2005	—	`conf`	A two-step DDEM ADC for accurate and cost-effective DAC testing. ISCAS (5) Hanqing Xing, Degang Chen, Randall L. Geiger
2005	J	`jnl`	Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans. Instrum. Meas. Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger
2005	—	`conf`	An N ISCAS (5) Xin Dai, Chengming He, Hanqing Xing, Degang Chen, Randall L. Geiger
2005	—	`conf`	An adaptive, truly background calibration method for high speed pipeline ADC design. ISCAS (6) Degang Chen, Zhongjun Yu, Randall L. Geiger
2005	—	`conf`	Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs. ISCAS (5) Hanjun Jiang, Degang Chen, Randall L. Geiger
2005	A	`conf`	High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen
2005	—	`conf`	Pipeline ADC linearity testing with dramatically reduced data capture time. ISCAS (1) Zhongjun Yu, Degang Chen, Randall L. Geiger, Ioannis Papantonopoulos
2004	A	`conf`	A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. ITC Zhongjun Yu, Degang Chen, Randall L. Geiger
2004	—	`conf`	A background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation. ISCAS (1) Hanjun Jiang, Haibo Fei, Degang Chen, Randall L. Geiger
2004	—	`conf`	A novel 1.5 V CMFB CMOS down-conversion mixer design for IEEE 802.11 A WLAN systems. ISCAS (4) Xuezhen Wang, Robert Weber, Degang Chen
2004	—	`conf`	Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations. ISCAS (1) Zhongjun Yu, Degang Chen, Randall L. Geiger
2004	—	`conf`	An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) Le Jin, Chengming He, Degang Chen, Randall L. Geiger
2004	—	`conf`	Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) Le Jin, Chengming He, Degang Chen, Randall L. Geiger
2004	—	`conf`	N ISCAS (1) Chengming He, Kuangming Yap, Degang Chen, Randall L. Geiger
2004	—	`conf`	Optimum area allocation for resistors and capacitors in continuous-time monolithic filters. ISCAS (1) Haibo Fei, Randall L. Geiger, Degang Chen
2004	—	`conf`	Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing. ISCAS (1) Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
2004	—	`conf`	Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) Chengming He, Le Jin, Degang Chen, Randall L. Geiger
2004	A	`conf`	Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. ITC Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger
2004	—	`conf`	Testing high resolution ADCs using deterministic dynamic element matching. ISCAS (1) Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
2004	—	`conf`	The SRE/SRM approach for spectral testing of AMS circuits. ISCAS (1) Zhongjun Yu, Degang Chen, Randall L. Geiger
2003	—	`conf`	1-D and 2-D switching strategies achieving near optimal INL for thermometer-coded current steering DACs. ISCAS (1) Zhongjun Yu, Degang Chen, Randall L. Geiger
2003	—	`conf`	A deterministic dynamic element matching approach to ADC testing. ISCAS (5) Beatriz Olleta, Lance Juffer, Degang Chen, Randall L. Geiger
2003	—	`conf`	A low-voltage compatible two-stage amplifier with ≥120 dB gain in standard digital CMOS. ISCAS (1) Chengming He, Degang Chen, Randall L. Geiger
2003	J	`jnl`	BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger
2003	—	`conf`	Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger
2003	A	`conf`	Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger
2001	—	`conf`	Automatic landing control using H CDC Jun Che, Degang Chen
2001	—	`conf`	Causal inversion of nonminimum phase systems. CDC Xuezhen Wang, Degang Chen
1999	J	`jnl`	Feedback control strategies for a nonholonomic mobile robot using a nonlinear oscillator. J. Field Robotics Ranjan Mukherjee, Degang Chen, Gangbing Song
1998	J	`jnl`	A finite energy property of stable inversion to nonminimum phase nonlinear systems. IEEE Trans. Autom. Control. Hongchao Zhao, Degang Chen
1996	J	`jnl`	Nonlinear inversion-based output tracking. IEEE Trans. Autom. Control. Santosh Devasia, Degang Chen, Brad Paden
1996	A*	`conf`	Optimal motion planning for flexible space robots. ICRA Hongchao Zhao, Degang Chen
1993	J	`jnl`	Adaptive linearization of hybrid step motors: stability analysis. IEEE Trans. Autom. Control. Degang Chen, Brad E. Paden
1993	J	`jnl`	Application of Kharitonov's theorem to mechanical systems. IEEE Trans. Autom. Control. Tesfay Meressi, Degang Chen, Brad E. Paden
1993	J	`jnl`	Control of free-flying underactuated space manipulators to equilibrium manifolds. IEEE Trans. Robotics Autom. Ranjan Mukherjee, Degang Chen