| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
IET Comput. Digit. Tech.
|
| 2018 | J | jnl |
Future Gener. Comput. Syst.
|
| 2018 | — | conf |
iSES
|
| 2018 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2018 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | — | conf |
iNIS
|
| 2016 | — | conf |
ISVLSI
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | — | conf |
iNIS
|