| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2017 | — | conf |
iNIS
|
| 2016 | J | jnl |
Microelectron. J.
|
| 2016 | J | jnl |
CoRR
|
| 2015 | J | jnl |
Int. J. Electron. Secur. Digit. Forensics
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | — | conf |
SSCC
|
| 2012 | — | conf |
CASE
|
| 2012 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2012 | — | conf |
ISVLSI
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | — | conf |
RAIT
|
| 2011 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2010 | J | jnl |
IET Comput. Digit. Tech.
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2009 | J | jnl |
IET Comput. Digit. Tech.
|
| 2008 | — | conf |
ATS
|
| 2006 | Misc | conf |
VLSI Design
|