Dean Lewis

54 papers A 1C 2Journal 48Unranked 3
YearRankTypeTitle / Venue / Authors
2015 J jnl
A way to implement the electro-optical technique to inertial MEMS.
Microelectron. Reliab.
Kevin Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis
2014 J jnl
A comprehensive study of the application of the EOP techniques on bipolar devices.
Microelectron. Reliab.
Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis
2013 J jnl
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes.
Microelectron. Reliab.
Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis
2013 J jnl
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.
Microelectron. Reliab.
I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu
2012 J jnl
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.
Microelectron. Reliab.
Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis
2012 J jnl
Effects of 1064 nm laser on MOS capacitor.
Microelectron. Reliab.
R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis
2012 J jnl
High performance thermography with InGaAs photon counting camera.
Microelectron. Reliab.
Guillaume Bascoul, Philippe Perdu, Maryse Béguin, Dean Lewis
2011 J jnl
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.
Microelectron. Reliab.
Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet
2011 J jnl
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization.
Microelectron. Reliab.
Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis
2011 J jnl
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory.
Microelectron. Reliab.
Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis
2011 J jnl
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis.
Microelectron. Reliab.
Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis
2010 J jnl
CADless laser assisted methodologies for failure analysis and device reliability.
Microelectron. Reliab.
A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis
2010 J jnl
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).
Microelectron. Reliab.
Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet
2010 J jnl
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations.
Microelectron. Reliab.
Fulvio Infante, Philippe Perdu, Dean Lewis
2009 J jnl
Editorial.
Microelectron. Reliab.
Dean Lewis, Nathalie Labat
2009 J jnl
Electrical modeling of the effect of beam profile for pulsed laser fault injection.
Microelectron. Reliab.
C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart
2009 J jnl
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package.
Microelectron. Reliab.
Fulvio Infante, Philippe Perdu, Dean Lewis
2009 J jnl
Net integrity checking by optical localization techniques.
Microelectron. Reliab.
Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget
2008 C conf
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection.
IOLTS
Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco
2008 J jnl
Effect of physical defect on shmoos in CMOS DSM technologies.
Microelectron. Reliab.
Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
2008 J jnl
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.
Microelectron. Reliab.
Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis
2008 J jnl
Generic simulator for faulty IC.
Microelectron. Reliab.
Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier
2007 A conf
Identification of process/design issues during 0.18 µm technology qualification for space application.
DATE
Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis
2006 J jnl
Application of various optical techniques for ESD defect localization.
Microelectron. Reliab.
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
2006 J jnl
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.
Microelectron. Reliab.
Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat
2005 J jnl
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectron. Reliab.
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
2005 C conf
Electrical Modeling for Laser Testing with Different Pulse Durations.
IOLTS
Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu
2005 J jnl
Impact of semiconductors material on IR Laser Stimulation signal.
Microelectron. Reliab.
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
2005 J jnl
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.
Microelectron. Reliab.
Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit
2005 J jnl
NIR laser stimulation for dynamic timing analysis.
Microelectron. Reliab.
Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis
2004 J jnl
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections.
Microelectron. Reliab.
Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis
2004 J jnl
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?
Microelectron. Reliab.
Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis
2004 J jnl
Study of the ESD defects impact on ICs reliability.
Microelectron. Reliab.
Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis
2004 J jnl
Time Resolved Photon Emission Processing Flow for IC Analysis.
Microelectron. Reliab.
Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis
2004 J jnl
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC.
IEEE Trans. Instrum. Meas.
Vincent Pouget, Dean Lewis, Pascal Fouillat
2004 J jnl
Understanding the effects of NIR laser stimulation on NMOS transistor.
Microelectron. Reliab.
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
2003 J jnl
A physical approach on SCOBIC investigation in VLSI.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
2003 J jnl
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.
Microelectron. Reliab.
G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
2003 J jnl
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).
Microelectron. Reliab.
Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat
2003 J jnl
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectron. Reliab.
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
2003 J jnl
Short defect characterization based on TCR parameter extraction.
Microelectron. Reliab.
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis
2003 J jnl
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
2003 J jnl
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.
Microelectron. Reliab.
Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis
2002 J jnl
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.
Microelectron. Reliab.
Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement
2002 J jnl
Backside Hot Spot Detection Using Liquid Crystal Microscopy.
Microelectron. Reliab.
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
2002 — conf
Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser.
LATW
Dean Lewis, Pascal Fouillat, Vincent Pouget
2002 J jnl
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.
Microelectron. Reliab.
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
2001 — conf
A New Laser System for X-Rays Flashes Sensitivity Evaluation.
IOLTW
Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat
2001 J jnl
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectron. Reliab.
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
2001 J jnl
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.
Microelectron. Reliab.
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
2001 J jnl
Modeling Thermal Laser Stimulation.
Microelectron. Reliab.
Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis
2001 J jnl
Silicon Thinning and Polishing on Packaged Devices.
Microelectron. Reliab.
Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis
2001 J jnl
Theoretical Investigation of an Equivalent Laser LET.
Microelectron. Reliab.
Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner
2000 — conf
An Overview of the Applications of a Pulsed Laser System for SEU Testing.
IOLTW
Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet