Dean G. Jarrett

18 papers Journal 18
YearRankTypeTitle / Venue / Authors
2025 J jnl
Implementation of a 1 GΩ Star-Mesh Graphene Quantized Hall Array Resistance Standard Network for High Resistance Calibration.
IEEE Trans. Instrum. Meas.
Marta Musso, Wei-Chen Lin, Yanfei Yang, Ngoc Thanh Mai Tran, Alireza R. Panna, Cheng-Hsueh Yang, Randolph E. Elmquist, David B. Newell, Chi-Te Liang, Massimo Ortolano, Albert F. Rigosi, Dean G. Jarrett
2023 J jnl
Graphene-Based Star-Mesh Resistance Networks.
IEEE Trans. Instrum. Meas.
Dean G. Jarrett, Ching-Chen Yeh, Shamith U. Payagala, Alireza R. Panna, Yanfei Yang, Linli Meng, Swapnil M. Mhatre, Ngoc Thanh Mai Tran, Heather M. Hill, Dipanjan Saha, Randolph E. Elmquist, David B. Newell, Albert F. Rigosi
2022 J jnl
Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge.
IEEE Trans. Instrum. Meas.
Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang
2020 J jnl
Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe.
IEEE Trans. Instrum. Meas.
Shamith U. Payagala, Albert F. Rigosi, Alireza R. Panna, Alessio Pollarolo, Mattias Kruskopf, Stephan Schlamminger, Dean G. Jarrett, Ryan Brown, Randolph E. Elmquist, Duane Brown, David B. Newell
2020 J jnl
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices.
IEEE Trans. Instrum. Meas.
Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett
2020 J jnl
Comparison of Multiple Methods for Obtaining P $\Omega$ Resistances With Low Uncertainties.
IEEE Trans. Instrum. Meas.
Kwang Min Yu, Dean G. Jarrett, Albert F. Rigosi, Shamith U. Payagala, Marlin Kraft
2020 J jnl
Using a Natural Ratio to Compare DC and AC Resistances.
IEEE Trans. Instrum. Meas.
Kwang Min Yu, Dean G. Jarrett, Andrew D. Koffman, Albert F. Rigosi, Shamith U. Payagala, Kwon Sang Ryu, Jeon Hong Kang, Sang Hwa Lee
2019 J jnl
Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards.
IEEE Trans. Instrum. Meas.
Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist
2019 J jnl
The units for mass, voltage, resistance, and electrical current in the SI.
IEEE Instrum. Meas. Mag.
Stephan Schlamminger, Patrick Abbott, Zeina Kubarych, Dean G. Jarrett, Randolph E. Elmquist
2013 J jnl
Report to TIM Editor on CPEM 2012.
IEEE Trans. Instrum. Meas.
Dean G. Jarrett
2009 J jnl
SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ.
IEEE Trans. Instrum. Meas.
Dean G. Jarrett, Randolph E. Elmquist, Nien Fan Zhang, Alejandra Tonina, Marta Porfiri, Janice de Brito Fernandes, Helio Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, David Inglis, Kai Wendler, Felipe Hernandez Marquez, Benjamín Rodríguez Medina
2005 J jnl
Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator.
IEEE Trans. Instrum. Meas.
Randolph E. Elmquist, Emmanouel Hourdakis, Dean G. Jarrett, Neil M. Zimmerman
2003 J jnl
CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards.
IEEE Trans. Instrum. Meas.
Dean G. Jarrett, Ronald F. Dziuba
2003 J jnl
Statistical uncertainty analysis of key comparison CCEM-K2.
IEEE Trans. Instrum. Meas.
Nien Fan Zhang, Nell Sedransk, Dean G. Jarrett
2001 J jnl
Analysis of a dual-balance high-resistance bridge at 10 TΩ.
IEEE Trans. Instrum. Meas.
Dean G. Jarrett
2001 J jnl
Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory.
IEEE Trans. Instrum. Meas.
Randolph E. Elmquist, Anne-Marie Jeffery, Dean G. Jarrett
1999 J jnl
Evaluation of guarded high-resistance Hamon transfer standards.
IEEE Trans. Instrum. Meas.
Dean G. Jarrett
1999 J jnl
Fabrication of high-value standard resistors.
IEEE Trans. Instrum. Meas.
Ronald F. Dziuba, Dean G. Jarrett, Lisa L. Scott, Andrew J. Secula