Davide Appello

58 papers A 11B 7C 12Misc 5Journal 10Unranked 13

Year	Rank	Type	Title / Venue / Authors
2025	B	`conf`	AI-Assisted Framework for Real-Time Monitoring and Management of Probe Cards in Electrical Wafer Sort Applications. ETS Mehdi Bejani, Davide Appello, Marco Mauri, Simone Todaro, Stefano Mariani
2024	A	`conf`	An AI-Enabled Framework for Smart Semiconductor Manufacturing. DATE Khaled Sidahmed Sidahmed Alamin, Davide Appello, Alessandro Beghi, Nicola Dall'Ora, Fabio Depaoli, Santa Di Cataldo, Franco Fummi, Sebastiano Gaiardelli, Michele Lora, Enrico Macii, Alessio Mascolini, Daniele Pagano, Francesco Ponzio, Gian Antonio Susto, Sara Vinco
2024	—	`conf`	Testing challenges along WBG and UWBG devices roadmap. DTTIS Elena Venuti, Davide Appello, Riccardo Vettori, Federico Fazio, Rosalia Biondi, Chiara Lauria, Tiziana Bertoncelli, Giancarlo Guida, Marco Occhiali
2023	J	`jnl`	A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023	J	`jnl`	A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023	Misc	`conf`	A guided debugger-based fault injection methodology for assessing functional test programs. VTS Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023	C	`conf`	About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2023	C	`conf`	Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023	—	`conf`	On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre
2022	—	`conf`	A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2022	—	`conf`	A novel SEU injection setup for Automotive SoC. ISIE Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	B	`conf`	An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	A	`conf`	An innovative Strategy to Quickly Grade Functional Test Programs. ITC Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	A	`conf`	In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. ITC Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2022	—	`conf`	Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	J	`jnl`	Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
2022	B	`conf`	Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli
2021	C	`conf`	Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
2021	—	`conf`	Innovative methods for Burn-In related Stress Metrics Computation. DTIS Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli
2021	C	`conf`	System-Level Test: State of the Art and Challenges. IOLTS Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda
2020	C	`conf`	Applicative System Level Test introduction to Increase Confidence on Screening Quality. DDECS Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali
2019	C	`conf`	Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi
2018	J	`jnl`	Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini
2018	J	`jnl`	An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini
2018	J	`jnl`	An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini
2017	—	`conf`	A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. LATS Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello
2017	A	`conf`	A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini
2017	—	`conf`	A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor. ITC-Asia Davide Appello, M. Laurino, Marco Pranzo
2013	B	`conf`	Current testing: Dead or alive? ETS Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello
2013	B	`conf`	Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman
2011	C	`conf`	Optimized embedded memory diagnosis. DDECS Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi
2010	A	`conf`	Adapting to adaptive testing. DATE Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli
2010	C	`conf`	Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda
2010	C	`conf`	Cumulative embedded memory failure bitmap display & analysis. DDECS Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone
2010	C	`conf`	Safety features of SoCs: How can they be re-used? DDECS Davide Appello
2009	C	`conf`	An I-IP based approach for the monitoring of NBTI effects in SoCs. IOLTS C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi
2009	B	`conf`	Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. ETS Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda
2009	Misc	`conf`	DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda
2009	J	`jnl`	Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. Very Large Scale Integr. Syst. Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
2009	C	`conf`	Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello
2008	B	`conf`	An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. ETS Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso
2008	A	`conf`	Robust Design-for-Productization Practices for High Quality Automotive Products. ITC Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello
2007	—	`conf`	An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda
2007	A	`conf`	Automotive IC's: less testing, more prevention. ITC Davide Appello
2006	A	`conf`	Embedded Memory Diagnosis: An Industrial Workflow. ITC Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2006	Misc	`conf`	On the Automation of the Test Flow of Complex SoCs. VTS Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2006	Misc	`conf`	Session Abstract. VTS Davide Appello
2006	J	`jnl`	System-in-Package Testing: Problems and Solutions. IEEE Des. Test Comput. Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda
2004	J	`jnl`	A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electron. Test. Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
2004	J	`jnl`	Understanding Yield Losses in Logic Circuits. IEEE Des. Test Comput. Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew
2004	Misc	`conf`	Yield Analysis of Logic Circuits. VTS Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre
2003	—	`conf`	A practical evaluation of I ETW Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve
2003	A	`conf`	Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante
2002	—	`conf`	A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
2002	—	`conf`	A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
2002	A	`conf`	High Accuracy Stimulus Generation for A/D Converter BIST. ITC Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello
2002	A	`conf`	The Yield of Test Outsourcing. ITC Davide Appello
2001	—	`conf`	A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. Asian Test Symposium Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda