David T. Miller

12 papers A* 2A 4C 2Journal 4
YearRankTypeTitle / Venue / Authors
1992 J jnl
Dynamic redundancy identification in automatic test generation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Miron Abramovici, David T. Miller, Rabindra K. Roy
1992 A* conf
Freeze!: A New Approach for Testing Sequential Circuits.
DAC
Miron Abramovici, Krishna B. Rajan, David T. Miller
1990 A conf
Global cost functions for test generation.
ITC
Miron Abramovici, David T. Miller, R. Henning
1989 A conf
Dynamic redundancy identification in automatic test generation.
ICCAD
Miron Abramovici, David T. Miller, Rabindra K. Roy
1989 C conf
System-level design verification in the AT&T Computer Division: tools.
ICCD
Miron Abramovici, James J. Kulikowski, David T. Miller, Prem R. Menon
1989 C conf
System-level design verification in the AT&T computer division: overview and strategy.
ICCD
Miron Abramovici, J. W. Bierbauer, R. H. Hellman, C. L. Hong, David T. Miller, R. G. Taylor
1986 J jnl
Checkpoint Faults are not Sufficient Target Faults for Test Generation.
IEEE Trans. Computers
Miron Abramovici, Prem R. Menon, David T. Miller
1986 J jnl
SMART and FAST: Test Generation for VLSI Scan-Design Circuits.
IEEE Des. Test
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
1985 A conf
Test Generation In Lamp2: Concepts and Algorithms.
ITC
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
1985 A conf
Test Generation In Lamp2: System Overview.
ITC
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
1984 J jnl
Critical Path Tracing: An Alternative to Fault Simulation.
IEEE Des. Test
Miron Abramovici, Prem R. Menon, David T. Miller
1983 A* conf
Critical path tracing - an alternative to fault simulation.
DAC
Miron Abramovici, Prem R. Menon, David T. Miller