David M. Wu - RankMe

14 papers A* 1A 7Misc 5Unranked 1

Year	Rank	Type	Title / Venue / Authors
2006	—	`conf`	A Low Cost, High Quality Embedded Array DFT Technique for High Performance Processors. DELTA Zhuoyu Bao, Suriya A. Kumar, David M. Wu, Vimal K. Natarajan, Mike Lin
2004	A	`conf`	An Optimized DFT and Test Pattern Generation Strategy for an Intel High Performance Microprocessor. ITC David M. Wu, Mike Lin, Madhukar Reddy, Talal Jaber, Anil Sabbavarapu, Larry Thatcher
2003	A	`conf`	H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. ITC David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish
2002	A	`conf`	Trouble With Scan. ITC David M. Wu
2000	Misc	`conf`	Cold Delay Defect Screening. VTS Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu
1999	A	`conf`	"DFY and DFR are more important than DFT". ITC David M. Wu
1999	A	`conf`	DFT is all I can afford, who cares about Design for Yield or Design for Reliability! ITC David M. Wu
1992	Misc	`conf`	Multiple redundancy removal during test generation and synthesis. VTS David M. Wu, Robert M. Swanson
1991	Misc	`conf`	An optimized delay testing technique for LSSD-based VLSI logic circuits. VTS David M. Wu
1991	A*	`conf`	Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. DAC David M. Wu, Charles E. Radke
1991	Misc	`conf`	Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits. VTS Waisum Wong, Juin J. Liou, Jiann-Shiun Yuan, David M. Wu
1991	Misc	`conf`	Testing the impact of process defects on ECL power-delay performance. VTS Jiann-Shiun Yuan, Juin J. Liou, David M. Wu
1986	A	`conf`	Statistical AC Test Coverage. ITC David M. Wu, Charles E. Radke, J. Paul Roth
1984	A	`conf`	Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC David M. Wu, Charles E. Radke, C. C. Beh