| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | — | conf |
ECCTD
|
| 2011 | — | conf |
ECCTD
|
| 2011 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2010 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2010 | C | conf |
ISCAS
|
| 2009 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2009 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2009 | J | jnl |
Evaluating the effects of temperature gradients and currents nonuniformity in on-chip interconnects.
Microelectron. J.
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | C | conf |
ISCAS
|
| 2008 | C | conf |
ISCAS
|
| 2007 | — | conf |
ECCTD
|
| 2007 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | C | conf |
ISCAS
|
| 1999 | — | conf |
ISCAS (6)
|
| 1995 | C | conf |
ISCAS
|
| 1993 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 1993 | C | conf |
ISCAS
|