| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | B | conf |
ETS
|
| 2024 | — | conf |
ITC-Asia
|
| 2023 | — | conf |
ITC-Asia
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2009 | A | conf |
ITC
|
| 2008 | A | conf |
ITC
|
| 2008 | J | jnl |
VLSI Design
|
| 2008 | A | conf |
Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications.
DATE
|
| 2007 | A | conf |
DATE
|
| 2007 | A | conf |
ITC
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2004 | A | conf |
ITC
|
| 2004 | J | jnl |
IEEE Des. Test Comput.
|
| 2003 | A | conf |
ITC
|