Danijel Dankovic

21 papers C 2Journal 18Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
A Method for Automatic Characterization and Measurement of Ceramic Materials Using Virtual Instrumentation.
J. Circuits Syst. Comput.
Milos Djordjevic, Vesna Paunovic, Danijel Dankovic
2025 C conf
AIDA4Edge: Twinning for Excellence in Adaptive Edge Artificial Intelligence.
DSD
Marko S. Andjelkovic, Rizwan Tariq Syed, Alessandro Veronesi, Fabian Vargas, Markus Ulbricht, Leticia Bolzani Poehls, Milos Krstic, Davide Bertozzi, Edward G. Jones, Oliver Rhodes, Riccardo Zese, Michele Favalli, Alice Bizzarri, Evelina Lamma, Marco Gavanelli, Elena Bellodi, Zoran Peric, Jelena Nikolic, Milan R. Dincic, Aleksandra Jovanovic, Dejan Ciric, Nikola Vucic, Sofija Peric, Jelena Jovanovic, Milica Stojanovic, Tatjana R. Nikolic, Goran Nikolic, Jelena Nedeljkovic, Danijel Dankovic, Emilija Zivanovic, Milos Marjanovic, Sandra Veljkovic, Nikola Mitrovic, Bratislav Predic, Tamara Milovanovic
2025 J jnl
Impact of Trapped Charge on the Breakdown Phenomena in HfO
J. Circuits Syst. Comput.
Dencho Spassov, Albena Paskaleva, E. Guziewicz, Tz. Ivanov, T. Stanchev, Vojkan Davidovic, Sandra Veljkovic, Nikola Mitrovic, Danijel Dankovic
2025 — conf
Prediction of Single Event Transient Propagation Using Machine Learning Models.
SMACD
Marko S. Andjelkovic, Junchao Chen, Jelisaveta Aleksic, Vishnu Padmakumar, Milos Marjanovic, Nikolaos Zazatis, Trupti Ranjan Lenka, Danijel Dankovic, Christos P. Sotiriou, Fabian Vargas
2023 J jnl
The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering.
IEEE Trans. Educ.
Danijel Dankovic, Milos Marjanovic, Nikola Mitrovic, Emilija Zivanovic, Milan Dankovic, Aneta Prijic, Zoran Prijic
2023 C conf
Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System.
DSD
Marko S. Andjelkovic, Junchao Chen, Rizwan Tariq Syed, Fabian Vargas, Markus Ulbricht, Milos Krstic, Stefan D. Ilic, Milos Marjanovic, Sandra Veljkovic, Nikola Mitrovic, Danijel Dankovic, Goran S. Ristic, Russell Duane, Nikola Vasovic, Aleksandar Jaksic, Alberto J. Palma, Antonio M. Lallena, Miguel Ángel Carvajal
2022 J jnl
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress.
J. Circuits Syst. Comput.
Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic
2020 J jnl
A smart data logger system based on sensor and Internet of Things technology as part of the smart faculty.
J. Ambient Intell. Smart Environ.
Milos Djordjevic, Branislav Jovicic, Stefan Markovic, Vesna Paunovic, Danijel Dankovic
2018 J jnl
A review of pulsed NBTI in P-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Ninoslav Stojadinovic
2018 J jnl
NBTI and irradiation related degradation mechanisms in power VDMOS transistors.
Microelectron. Reliab.
Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic
2013 J jnl
An Electromechanical Approach to a Printed Circuit Board Design Course.
IEEE Trans. Educ.
Danijel Dankovic, Ljubomir Vracar, Aneta Prijic, Zoran Prijic
2011 J jnl
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.
Microelectron. Reliab.
Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic
2010 J jnl
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.
Microelectron. Reliab.
Ninoslav Stojadinovic, Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic
2009 J jnl
Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs.
Microelectron. Reliab.
Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
2008 J jnl
Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs.
IET Circuits Devices Syst.
Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Ninoslav Stojadinovic
2008 J jnl
Negative bias temperature instability in n-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic
2007 J jnl
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic
2006 J jnl
NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
2005 J jnl
Effects of electrical stressing in power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Vojkan Davidovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Sima Dimitrijev
2005 J jnl
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Ivica Manic, Snezana Golubovic
2002 J jnl
Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Sima Dimitrijev