Daniela Munteanu

11 papers Journal 11
YearRankTypeTitle / Venue / Authors
2017 J jnl
Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs.
Microelectron. Reliab.
Soilihi Moindjie, Jean-Luc Autran, Daniela Munteanu, Gilles Gasiot, Philippe Roche
2017 J jnl
Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation.
Microelectron. Reliab.
Daniela Munteanu, Jean-Luc Autran, Soilihi Moindjie
2016 J jnl
Natural radiation events in CCD imagers at ground level.
Microelectron. Reliab.
Tarek Saad Saoud, Soilihi Moindjie, Daniela Munteanu, Jean-Luc Autran
2015 J jnl
3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs.
Microelectron. Reliab.
Daniela Munteanu, Jean-Luc Autran
2015 J jnl
ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure.
Microelectron. Reliab.
Jean-Luc Autran, Daniela Munteanu, Soilihi Moindjie, Tarek Saad Saoud, S. Sauze, Gilles Gasiot, Philippe Roche
2015 J jnl
Radiation and COTS at ground level.
Microelectron. Reliab.
Jean-Luc Autran, Daniela Munteanu
2015 J jnl
SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation.
Microelectron. Reliab.
Daniela Munteanu, Jean-Luc Autran
2014 J jnl
Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits.
Microelectron. Reliab.
Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche
2014 J jnl
Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation.
Microelectron. Reliab.
Daniela Munteanu, Jean-Luc Autran
2014 J jnl
Real-time soft-error rate measurements: A review.
Microelectron. Reliab.
Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot
2010 J jnl
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level.
Microelectron. Reliab.
Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, Pia Loaiza, G. Warot, M. Zampaolo