Daniel Tille

30 papers A 3B 5C 4Misc 1Journal 6Unranked 10
YearRankTypeTitle / Venue / Authors
2025 B conf
European Test Symposium Teams: an Anniversary Snapshot.
ETS
Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025 — conf
Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG.
ITC-Asia
Alessandro Ciullo, Stephan Eggersglüß, Daniel Tille, Andreas Glowatz, Giusy Iaria, Paolo Bernardi
2025 B conf
Self-Aware Silicon: Enhancing Lifecycle Management with Intelligent Testing and Data Insights.
ETS
Fabian Vargas, Marko S. Andjelkovic, Milos Krstic, Anirban Kar, Swati Deshwal, Yogesh Singh Chauhan, Hussam Amrouch, Daniel Tille, Sebastian Huhn
2024 J jnl
On the Relation Between Reliability and Entropy in Physical Unclonable Functions.
IEEE Des. Test
Vasilii Kulagin, Sergio Vinagrero Gutierrez, Tobias Kilian, Daniel Tille, Ulf Schlichtmann, Giorgio Di Natale, Elena-Ioana Vatajelu
2023 Misc conf
A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin.
VTS
Daniel Tille, Leon Klimasch, Sebastian Huhn
2023 — conf
An efficient High-Volume Production Performance Screening using On-Chip Ring Oscillators.
DFT
Tobias Kilian, Abhishek Sengupta, Daniel Tille, Martin Huch, Ulf Schlichtmann
2023 J jnl
Performance Screening Using Functional Path Ring Oscillators.
IEEE Trans. Very Large Scale Integr. Syst.
Tobias Kilian, Daniel Tille, Martin Huch, Markus Hanel, Ulf Schlichtmann
2022 A conf
A Path Selection Flow for Functional Path Ring Oscillators using Physical Design Data.
ITC
Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann
2022 B conf
Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators.
ETS
Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann
2021 A conf
A Scalable Design Flow for Performance Monitors Using Functional Path Ring Oscillators.
ITC
Tobias Kilian, Heiko Ahrens, Daniel Tille, Martin Huch, Ulf Schlichtmann
2021 J jnl
Time and Area Optimized Testing of Automotive ICs.
IEEE Trans. Very Large Scale Integr. Syst.
Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2019 — conf
A Hybrid Embedded Multichannel Test Compression Architecture for Low-Pin Count Test Environments in Safety-Critical Systems.
ITC-Asia
Sebastian Huhn, Daniel Tille, Rolf Drechsler
2019 B conf
Hybrid Architecture for Embedded Test Compression to Process Rejected Test Patterns.
ETS
Sebastian Huhn, Daniel Tille, Rolf Drechsler
2019 A conf
Test Time and Area Optimized BrST Scheme for Automotive ICs.
ITC
Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki
2018 — conf
On enabling diagnosis for 1-Pin Test fails in an industrial flow.
ASP-DAC
Daniel Tille, Benedikt Gottinger, Ulrike Pfannkuchen, Helmut Graeb, Ulf Schlichtmann
2017 — conf
A lightweight X-masking scheme for IoT designs.
ITC-Asia
Daniel Tille, Benedikt Gottinger, Ulrike Pfannkuchen
2016 — conf
Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test.
ATS
Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen
2014 — conf
Automated formal verification of X propagation with respect to testability issues.
IDT
Mehdi Dehbashi, Daniel Tille, Ulrike Pfannkuchen, Stephan Eggersglüß
2010 C conf
Efficient test generation with maximal crosstalk-induced noise using unconstrained aggressor excitation.
ISCAS
Stephan Eggersglüß, Daniel Tille, Rolf Drechsler
2010 B conf
Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs.
ETS
Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler
2010 J jnl
Incremental Solving Techniques for SAT-based ATPG.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Tille, Stephan Eggersglüß, Rolf Drechsler
2009 C conf
A fast untestability proof for SAT-based ATPG.
DDECS
Daniel Tille, Rolf Drechsler
2009 J jnl
Effiziente Erfüllbarkeitsalgorithmen für die Generierung von Testmustern (Efficient Satisfiability Solving Algorithms for Test Pattern Generation).
it Inf. Technol.
Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Jürgen Schlöffel, Daniel Tille
2009 — conf
Speeding up SAT-Based ATPG Using Dynamic Clause Activation.
Asian Test Symposium
Stephan Eggersglüß, Daniel Tille, Rolf Drechsler
2009 — book
Test Pattern Generation using Boolean Proof Engines.
Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Daniel Tille
2008 C conf
Incremental SAT Instance Generation for SAT-based ATPG.
DDECS
Daniel Tille, Rolf Drechsler
2008 J jnl
On Acceleration of SAT-Based ATPG for Industrial Designs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille
2008 — conf
SAT-based Automatic Test Pattern Generation.
Evolutionary Test Generation
Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Daniel Tille
2007 — conf
Experimental Studies on SAT-Based ATPG for Gate Delay Faults.
ISMVL
Stephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
2007 C conf
Instance Generation for SAT-based ATPG.
DDECS
Daniel Tille, Görschwin Fey, Rolf Drechsler