| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
AI Mag.
|
| 2024 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2024 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IEEE Access
|
| 2022 | — | conf |
HOST
|
| 2022 | — | conf |
Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies.
DFT
|
| 2022 | — | conf |
DFT
|
| 2021 | — | conf |
ARCS
|
| 2020 | — | conf |
MWSCAS
|
| 2020 | — | conf |
MWSCAS
|
| 2019 | — | conf |
MWSCAS
|
| 2018 | — | conf |
DFT
|
| 2017 | — | conf |
MWSCAS
|
| 2015 | B | conf |
ICCCN
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | A* | conf |
DAC
|
| 2012 | — | conf |
ISVLSI
|
| 2012 | C | conf |
ICCD
|
| 2011 | B | conf |
TrustCom
|
| 2011 | — | conf |
DFT
|