Daniel Arumí

25 papers A 1B 4C 2Misc 3Journal 10Unranked 5
YearRankTypeTitle / Venue / Authors
2024 — conf
Engineering UGR-VCMTCF RRAM Model for Adjusting to TiN/Ti/HfO2/W Devices.
DCIS
Vahab Mahboubi, Á. Gómez, Antonio Calomarde, Daniel Arumí, R. Rodríguez, Salvador Manich
2024 C conf
On the Fine Tuning of RRAM Resistance Under Variability Using Current Pulses at SET.
IOLTS
Vahab Mahboubi, Á. Gómez, Antonio Calomarde, Daniel Arumí, R. Rodríguez, Salvador Manich
2023 J jnl
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs.
IEEE Access
Maryam Akbari, Sattar Mirzakuchaki, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Francesca Campabadal, Mireia Bargallo González, Rosa Rodríguez-Montañés
2022 — conf
On the Fitting and Improvement of RRAM Stanford-Based Model Parameters Using TiN/Ti/HfO2/W Experimental Data.
DCIS
Vahab Mahboubi, Daniel Arumí, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Salvador Manich
2021 — conf
Low Cost AES Protection Against DPA Using Rolling Codes.
DCIS
P. Albiol, Salvador Manich, Daniel Arumí, Rosa Rodríguez-Montañés, Álvaro Gómez-Pau
2021 — conf
Simulation of serial RRAM cell based on a Verilog-A compact model.
DCIS
Binbin Yang, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Juan Bautista Roldán, Mireia Bargallo González, Francesca Campabadal, Liang Fang
2020 J jnl
A forming-free ReRAM cell with low operating voltage.
IEICE Electron. Express
Binbin Yang, Nuo Xu, Cheng Li, Chenglong Huang, Desheng Ma, Jiahao Liu, Daniel Arumí, Liang Fang
2019 J jnl
Postbond Test of Through-Silicon Vias With Resistive Open Defects.
IEEE Trans. Very Large Scale Integr. Syst.
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras
2016 J jnl
Prebond Testing of Weak Defects in TSVs.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2016 — conf
RRAM based cell for hardware security applications.
IVSW
Daniel Arumí, Salvador Manich, Rosa Rodríguez-Montañés
2016 J jnl
Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2014 B conf
Post-bond test of Through-Silicon Vias with open defects.
ETS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras
2014 C conf
Pre-bond testing of weak defects in TSVs.
IOLTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2013 B conf
BIST architecture to detect defects in tsvs during pre-bond testing.
ETS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2013 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 J jnl
Gate Leakage Impact on Full Open Defects in Interconnect Lines.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2010 B conf
Diagnosis of full open defects in interconnect lines with fan-out.
ETS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2009 J jnl
Delay caused by resistive opens in interconnecting lines.
Integr.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2008 J jnl
Experimental Characterization of CMOS Interconnect Open Defects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2008 Misc conf
Full Open Defects in Nanometric CMOS.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008 A conf
Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
ITC
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2007 Misc conf
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 Misc conf
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2005 B conf
Defective behaviours of resistive opens in interconnect lines.
ETS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras