| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Integr.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
Integr.
|
| 2025 | C | conf |
DDECS
|
| 2023 | J | jnl |
Sensors
|
| 2023 | — | conf |
MIXDES
|
| 2023 | — | conf |
MIPRO
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2022 | C | conf |
DDECS
|
| 2022 | — | conf |
MIPRO
|
| 2022 | — | conf |
RADIOELEKTRONIKA
|
| 2022 | C | conf |
DDECS
|
| 2021 | C | conf |
DDECS
|
| 2021 | — | conf |
AFRICON
|
| 2021 | C | conf |
Enhanced Reliability of Fully Differential Difference Amplifier Through On-chip Digital Calibration.
DDECS
|
| 2021 | — | conf |
MIPRO
|
| 2021 | — | conf |
MIXDES
|
| 2021 | J | jnl |
Sensors
|
| 2020 | — | conf |
RADIOELEKTRONIKA
|
| 2020 | C | conf |
DDECS
|
| 2020 | — | conf |
MIPRO
|
| 2019 | C | conf |
DDECS
|
| 2019 | — | conf |
AFRICON
|
| 2019 | — | conf |
MIXDES
|
| 2019 | C | conf |
DDECS
|
| 2019 | — | conf |
MIPRO
|
| 2018 | — | conf |
MIPRO
|
| 2018 | C | conf |
DDECS
|
| 2018 | C | conf |
DDECS
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | — | conf |
AFRICON
|
| 2017 | C | conf |
DDECS
|
| 2016 | C | conf |
DDECS
|
| 2016 | C | conf |
DDECS
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2016 | C | conf |
DDECS
|
| 2016 | C | conf |
DDECS
|
| 2016 | — | conf |
MIPRO
|
| 2015 | C | conf |
DDECS
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
MIXDES
|
| 2014 | J | jnl |
Microprocess. Microsystems
|
| 2014 | C | conf |
DDECS
|
| 2014 | C | conf |
DDECS
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | C | conf |
DDECS
|
| 2013 | C | conf |
DDECS
|
| 2012 | C | conf |
DDECS
|
| 2012 | C | conf |
DDECS
|
| 2011 | C | conf |
DDECS
|
| 2011 | C | conf |
DDECS
|