| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2022 | C | conf |
IECON
|
| 2022 | C | conf |
IECON
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | C | conf |
IECON
|
| 2020 | C | conf |
IECON
|
| 2020 | — | conf |
ICARM
|
| 2020 | C | conf |
IECON
|
| 2019 | C | conf |
IECON
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | — | conf |
ISIE
|
| 2019 | — | conf |
EVER
|
| 2019 | — | conf |
EVER
|
| 2019 | C | conf |
IECON
|
| 2019 | — | conf |
EVER
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2015 | C | conf |
INDIN
|
| 2015 | — | conf |
ISIE
|
| 2015 | — | conf |
ICIT
|
| 2014 | — | conf |
ISIE
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
ISGT Europe
|
| 2013 | C | conf |
IECON
|