| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2025 | C | conf |
A Lightweight Method Based on YOLOv8 for Metal Surface Defect Detection in Industrial Manufacturing.
ISNN
|
| 2024 | C | conf |
IGARSS
|
| 2024 | — | conf |
ASCC
|
| 2023 | — | conf |
ICACI
|
| 2023 | — | conf |
ICACI
|
| 2021 | J | jnl |
IEEE Trans. Image Process.
|
| 2019 | — | conf |
SSCI
|
| 2018 | J | jnl |
Image Vis. Comput.
|
| 2017 | — | conf |
ICONIP (4)
|
| 2016 | B | conf |
SMC
|
| 2014 | C | conf |
ISNN
|
| 2013 | J | jnl |
J. Vis. Commun. Image Represent.
|