Daeil Kwon

13 papers Journal 13
YearRankTypeTitle / Venue / Authors
2026 J jnl
Reliability Risk Assessment and Standardization Strategy for Single-Phase Immersion-Cooled Data Center.
IEEE Access
Jungeon Lee, Daeil Kwon
2025 J jnl
Synthetic Fault Data Generation for Gas Turbine Power Plant Diagnosis Using Exhaust Temperature Imbalance.
IEEE Access
Jiwoon Han, Daeil Kwon
2021 J jnl
A Novel Prognostics Approach Using Shifting Kernel Particle Filter of Li-Ion Batteries Under State Changes.
IEEE Trans. Ind. Electron.
Seokgoo Kim, Hyung Jun Park, Jooho Choi, Daeil Kwon
2021 J jnl
Capacity-Fading Behavior Analysis for Early Detection of Unhealthy Li-Ion Batteries.
IEEE Trans. Ind. Electron.
Changyong Lee, Sugyeong Jo, Daeil Kwon, Michael G. Pecht
2019 J jnl
Adaptive SVM-based real-time quality assessment for primer-sealer dispensing process of sunroof assembly line.
Reliab. Eng. Syst. Saf.
Yeong-gwang Oh, Kasin Ransikarbum, Moise Busogi, Daeil Kwon, Namhun Kim
2019 J jnl
Dynamics of Bubble Behavior in Nucleate Boiling of R134a in an Enhanced Horizontal Tube.
IEEE Access
Kyoungmin Koo, Daeil Kwon
2019 J jnl
PHM-based wiring system damage estimation for near zero downtime in manufacturing facilities.
Reliab. Eng. Syst. Saf.
Jinwoo Lee, Daeil Kwon, Namhun Kim, Changyong Lee
2019 J jnl
Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management.
IEEE Trans. Ind. Electron.
Jinwoo Lee, Daeil Kwon, Michael G. Pecht
2018 J jnl
A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regression.
Microelectron. Reliab.
Changyong Lee, Daeil Kwon
2018 J jnl
Development of a Non-Invasive On-Chip Interconnect Health Sensing Method Based on Bit Error Rates.
Sensors
Insun Shin, Kyoungmin Koo, Daeil Kwon
2017 J jnl
A digital technique for diagnosing interconnect degradation by using digital signal characteristics.
Microelectron. J.
Jinwoo Lee, Daeil Kwon
2017 J jnl
Industry 4.0: A Special Section in IEEE Access.
IEEE Access
Shun-Feng Su, Imre J. Rudas, Jacek M. Zurada, Meng Joo Er, Jyh-Horng Chou, Daeil Kwon
2016 J jnl
IoT-Based Prognostics and Systems Health Management for Industrial Applications.
IEEE Access
Daeil Kwon, Melinda R. Hodkiewicz, Jiajie Fan, Tadahiro Shibutani, Michael G. Pecht