| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
SBCCI
|
| 2025 | C | conf |
ISCAS
|
| 2024 | — | conf |
ATS
|
| 2024 | — | conf |
3DIC
|
| 2023 | J | jnl |
Integr.
|
| 2022 | J | jnl |
Microelectron. J.
|
| 2021 | — | conf |
ITC-Asia
|
| 2021 | J | jnl |
Integr.
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
IEICE Trans. Electron.
|
| 2010 | J | jnl |
Comput. Electr. Eng.
|
| 2009 | C | conf |
PRDC
|
| 2009 | — | conf |
CSE (2)
|
| 2007 | — | conf |
ATS
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2003 | — | conf |
Asian Test Symposium
|