Cristina De Luca

13 papers C 4Misc 1Journal 1Unranked 7
YearRankTypeTitle / Venue / Authors
2022 C conf
Physical and digital worlds: implications and opportunities of the metaverse.
ISM
Fabio De Felice, Cristina De Luca, Simona Di Chiara, Antonella Petrillo
2021 C conf
A review of energy-based indicators for assessing sustainability and circular economy in the agri-food production.
ISM
Luca Silvestri, Cecilia Silvestri, Antonio Forcina, Cristina De Luca
2021 C conf
Artificial Intelligence or Augmented Intelligence? Impact on our lives, rights and ethics.
ISM
Fabio De Felice, Antonella Petrillo, Cristina De Luca, Ilaria Baffo
2018 — conf
Accuracy and Robustness Against Covariate Shift of Water Chiller Models.
CASE
Federica Acerbi, Giuseppe De Nicolao, Josef Obiltschnig, Patrick Richter, Cristina De Luca
2015 J jnl
A Sampling Decision System for Virtual Metrology in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Daniel Kurz, Cristina De Luca, Jürgen Pilz
2014 Misc conf
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements.
WSC
Daniel Kurz, Jürgen Pilz, Andrea Schirru, Simone Pampuri, Cristina De Luca
2013 — conf
Monitoring virtual metrology reliability in a sampling decision system.
CASE
Daniel Kurz, Cristina De Luca, Jürgen Pilz
2012 — conf
Multistep virtual metrology approaches for semiconductor manufacturing processes.
CASE
Simone Pampuri, Andrea Schirru, Gian Antonio Susto, Cristina De Luca, Alessandro Beghi, Giuseppe De Nicolao
2012 — conf
Sampling Decision System in semiconductor manufacturing using Virtual Metrology.
CASE
Daniel Kurz, Cristina De Luca, Jürgen Pilz
2011 — conf
A Predictive Maintenance System for Silicon Epitaxial Deposition.
CASE
Gian Antonio Susto, Alessandro Beghi, Cristina De Luca
2011 C conf
A Virtual Metrology system for predicting CVD thickness with equipment variables and qualitative clustering.
ETFA
Gian Antonio Susto, Alessandro Beghi, Cristina De Luca
2011 — conf
Nonparametric Virtual Sensors for Semiconductor Manufacturing - Using Information Theoretic Learning and Kernel Machines.
ICINCO (2)
Andrea Schirru, Simone Pampuri, Cristina De Luca, Giuseppe De Nicolao
2011 — conf
Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing.
CASE
Simone Pampuri, Andrea Schirru, Cristina De Luca, Giuseppe De Nicolao