Cristell Maneux

46 papers A 2C 3Journal 17Unranked 24
YearRankTypeTitle / Venue / Authors
2025 A conf
Multi-Partner Project: Smart Sensor Analog Front-Ends Powered by Emerging Reconfigurable Devices (SENSOTERIC).
DATE
Giulio Galderisi, Andreas Kramer, Andreas Fuchsberger, Jose Maria Gonzalez-Medina, Yuxuan He, Lee-Chi Hung, Marrit Jen Hong Li, Julian Kulenkampff, Maximilian Reuter, Lukas Wind, Masiar Sistani, Thomas Mikolajick, Bruno Neckel Wesling, Marina Deng, Cristell Maneux, Pieter Harpe, Sonia Prado-López, Oskar Baumgartner, Chhandak Mukherjee, Eugenio Cantatore, Sandro Carrara, Klaus Hofmann, Walter M. Weber, Jens Trommer
2024 A conf
FVLLMONTI: The 3D Neural Network Compute Cube $(N^{2}C^{2})$ Concept for Efficient Transformer Architectures Towards Speech-to-Speech Translation.
DATE
Ian O'Connor, Sara Mannaa, Alberto Bosio, Bastien Deveautour, Damien Deleruyelle, Tetiana Obukhova, Cédric Marchand, Jens Trommer, Çigdem Çakirlar, Bruno Neckel Wesling, Thomas Mikolajick, Oskar Baumgartner, Mischa Thesberg, David Pirker, Christoph Lenz, Zlatan Stanojevic, Markus Karner, Guilhem Larrieu, Sylvain Pelloquin, Konstantinous Moustakas, Jonas Müller, Giovanni Ansaloni, Alireza Amirshahi, David Atienza, Jean-Luc Rouas, Leila Ben Letaifa, Georgeta Bordeall, Charles Brazier, Chhandak Mukherjee, Marina Deng, Yifan Wang, Marc François, Houssem Rezgui, Reveil Lucas, Cristell Maneux
2023 — conf
Electrothermal modeling of junctionless vertical Si nanowire transistors for 3D logic circuit design.
ESSDERC
Yifan Wang, Chhandak Mukherjee, Houssem Rezgui, Marina Deng, Cristell Maneux, Sara Mannaa, Ian O'Connor, Jonas Müller, Sylvain Pelloquin, Guilhem Larrieu
2023 J jnl
InP DHBT Analytical Modeling: Toward THz Transistors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Nil Davy, Virginie Nodjiadjim, Muriel Riet, Colin Mismer, Marina Deng, Chhandak Mukherjee, Bertrand Ardouin, Cristell Maneux
2023 J jnl
SPICE Modeling in Verilog-A for Photo-Response in UTC-Photodiodes Targeting Beyond-5G Circuit Design.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
C. Mukherjee, Djeber Guendouz, Marina Deng, H. Bertin, Antoine Bobin, Nicolas Vaissiere, Christophe Caillaud, Akshay M. Arabhavi, Rimjhim Chaudhary, Olivier Ostinelli, Colombo R. Bolognesi, Patrick Mounaix, Cristell Maneux
2022 — conf
A Logic Cell Design and routing Methodology Specific to VNWFET.
NEWCAS
Arnaud Poittevin, Ian O'Connor, Cédric Marchand, Alberto Bosio, Cristell Maneux, Chhandak Mukherjee, Guilhem Larrieu, Abhishek Kumar
2022 C conf
Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors.
VLSI-SoC
Lucas Réveil, Chhandak Mukherjee, Cristell Maneux, Marina Deng, François Marc, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu, Arnaud Poittevin, Ian O'Connor, Oskar Baumgartner, David Pirker
2022 — conf
InP DHBT test structure optimization towards 110 GHz characterization.
ESSDERC
Nil Davy, Marina Deng, Virginie Nodjiadjim, Chhandak Mukherjee, Muriel Riet, Colin Mismer, Jérémie Renaudier, Cristell Maneux
2021 — conf
0.4-μm InP/InGaAs DHBT with a 380-GHz ${f_{T}}$, > 600-GHz $f_{\max}$ and BVCE0 > 4.5 V.
BCICTS
Nil Davy, Virginie Nodjiadjim, Muriel Riet, Colin Mismer, Marina Deng, Chhandak Mukherjee, Jérémie Renaudier, Cristell Maneux
2021 — conf
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance.
BCICTS
Sébastien Fregonese, Chhandak Mukherjee, Holger Rücker, Pascal Chevalier, Gerhard Fischer, Didier Céli, Marina Deng, Marine Couret, François Marc, Cristell Maneux, Thomas Zimmer
2021 — conf
Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology.
ESSDERC
C. Mukherjee, Marine Couret, Cristell Maneux, Didier Céli
2021 — conf
InP DHBT Characterization up to 500 GHz and Compact Model Validation Towards THz Circuit Design.
BCICTS
Marina Deng, Chhandak Mukherjee, Nil Davy, Virginie Nodjiadjim, Muriel Riet, Colin Mismer, Jérémie Renaudier, Magali De Matos, Cristell Maneux
2021 — conf
Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions.
ATS
Yen Tran, Toshihiro Nomura, Mohamed Salim Cherchali, Claire Tassin, Yann Deval, Cristell Maneux
2021 — conf
Ultra Compact High responsivity Photodiodes for >100 Gbaud Applications.
ECOC
Christophe Caillaud, H. Bertin, Antoine Bobin, R. Gnanamani, Nicolas Vaissiere, Frédéric Pommereau, Jean Decobert, Cristell Maneux
2020 C conf
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model.
VLSI-SOC
Chhandak Mukherjee, Marina Deng, François Marc, Cristell Maneux, Arnaud Poittevin, Ian O'Connor, Sébastien Le Beux, Cédric Marchand, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu
2020 — conf
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model.
VLSI-SoC (Selected Papers)
Arnaud Poittevin, Chhandak Mukherjee, Ian O'Connor, Cristell Maneux, Guilhem Larrieu, Marina Deng, Sébastien Le Beux, François Marc, Aurélie Lecestre, Cédric Marchand, Abhishek Kumar
2020 J jnl
3D logic cells design and results based on Vertical NWFET technology including tied compact model.
CoRR
C. Mukherjee, Marina Deng, François Marc, Cristell Maneux, Arnaud Poittevin, Ian O'Connor, Sébastien Le Beux, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu
2019 — conf
First Uni-Traveling Carrier Photodiode Compact Model Enabling Future Terahertz Communication System Design.
ESSDERC
Chhandak Mukherjee, Patrick Mounaix, Cristell Maneux, Michele Natrella, James Seddon, Chris Graham, Cyril C. Renaud
2019 — conf
Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current.
ESSDERC
Marine Couret, Gerhard Fischer, Iria Garcia-Lopez, Magali De Matos, François Marc, Cristell Maneux
2019 — conf
Measurement based accurate definition of the SOA edges for SiGe HBTs.
BCICTS
Mathieu Jaoul, Didier Céli, Cristell Maneux, Thomas Zimmer
2018 J jnl
Multiscaled Simulation Methodology for Neuro-Inspired Circuits Demonstrated with an Organic Memristor.
IEEE Trans. Multi Scale Comput. Syst.
Christopher H. Bennett, Jean-Etienne Lorival, François Marc, Theo Cabaret, Bruno Jousselme, Vincent Derycke, Jacques-Olivier Klein, Cristell Maneux
2017 — conf
1/f Noise in 3D vertical gate-all-around junction-less silicon nanowire transistors.
ESSDERC
Chhandak Mukherjee, Cristell Maneux, Julien Pezard, Guilhem Larrieu
2017 — conf
Avalanche compact model featuring SiGe HBTs characteristics up to BVcbo.
ESSDERC
Mathieu Jaoul, Didier Céli, Cristell Maneux, Michael Schröter, Andreas Pawlak
2017 J jnl
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.
Microelectron. Reliab.
C. Mukherjee, Thomas Jacquet, Anjan Chakravorty, Thomas Zimmer, Josef Boeck, Klaus Aufinger, Cristell Maneux
2017 J jnl
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications.
Proc. IEEE
Pascal Chevalier, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Böck, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann, Rickard Lovblom, Cristell Maneux, Olivier Ostinelli, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer
2016 — conf
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations.
ESSDERC
C. Mukherjee, Thomas Jacquet, Thomas Zimmer, Cristell Maneux, Anjan Chakravorty, Josef Boeck, Klaus Aufinger
2016 — conf
Physics-based electrical compact model for monolayer Graphene FETs.
ESSDERC
Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer, Wei Wei, Henri Happy
2015 — conf
A new physics-based compact model for Bilayer Graphene Field-Effect Transistors.
ESSDERC
Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer
2015 — conf
Characterization and modeling of low-frequency noise in CVD-grown graphene FETs.
ESSDERC
C. Mukherjee, Jorgue Daniel Aguirre Morales, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, Wei Wei
2015 C conf
Graphene FET evaluation for RF and mmWave circuit applications.
ISCAS
Sébastien Fregonese, Jorgue Daniel Aguirre Morales, Magali De Matos, Cristell Maneux, Thomas Zimmer
2015 J jnl
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.
Microelectron. Reliab.
Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux
2015 — conf
Substrate-coupling effect in BiCMOS technology for millimeter wave applications.
NEWCAS
Sébastien Fregonese, Rosario D'Esposito, Magali De Matos, Andreas Kohler, Cristell Maneux, Thomas Zimmer
2014 — conf
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation.
ESSDERC
C. Mukherjee, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, David Mele
2012 — conf
Advancements on reliability-aware analog circuit design.
ESSCIRC
Bertrand Ardouin, Jean-Yves Dupuy, Jean Godin, Virginie Nodjiadjim, Muriel Riet, François Marc, Gilles Amadou Koné, Sudip Ghosh, Brice Grandchamp, Cristell Maneux
2012 — conf
Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz.
ESSDERC
Mario Weis, Sébastien Fregonese, Marco Santorelli, Amit Kumar Sahoo, Cristell Maneux, Thomas Zimmer
2011 J jnl
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices.
IEEE Trans. Circuits Syst. I Regul. Pap.
Si-Yu Liao, Jean-Marie Retrouvey, Guillaume Agnus, Weisheng Zhao, Cristell Maneux, Sébastien Fregonese, Thomas Zimmer, Djaafar Chabi, Arianna Filoramo, Vincent Derycke, Christian Gamrat, Jacques-Olivier Klein
2011 J jnl
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design.
Microelectron. Reliab.
Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin
2011 J jnl
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses.
Microelectron. Reliab.
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin
2010 — conf
From nanoscale technology scenarios to compact device models for ambipolar devices.
ICECS
Sébastien Fregonese, Cristell Maneux, Thomas Zimmer
2010 J jnl
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT.
Microelectron. Reliab.
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin
2010 J jnl
Thermal aging model of InP/InGaAs/InP DHBT.
Microelectron. Reliab.
Sudip Ghosh, François Marc, Cristell Maneux, Brice Grandchamp, G. A. Koné, Thomas Zimmer
2007 J jnl
CNTFET Modeling and Reconfigurable Logic-Circuit Design.
IEEE Trans. Circuits Syst. I Regul. Pap.
Ian O'Connor, Junchen Liu, Frédéric Gaffiot, Fabien Prégaldiny, Christophe Lallement, Cristell Maneux, Johnny Goguet, Sébastien Fregonese, Thomas Zimmer, Lorena Anghel, Trong-Trinh Dang, Régis Leveugle
2004 J jnl
Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors.
Microelectron. Reliab.
Nathalie Labat, Nathalie Malbert, Cristell Maneux, André Touboul
2004 J jnl
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise.
Microelectron. Reliab.
Brice Grandchamp, Cristell Maneux, Nathalie Labat, André Touboul, Thomas Zimmer
2003 J jnl
1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses.
Microelectron. Reliab.
J. C. Martin, Cristell Maneux, Nathalie Labat, André Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin
2003 J jnl
High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects.
Microelectron. Reliab.
Mohamed Belhaj, Cristell Maneux, Nathalie Labat, André Touboul, Philippe Bove